Inventor

CHEN YING-YEN

TW23 patents

⚠️ This page may combine multiple inventors who share the name “CHEN YING-YEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHEN YING-YEN

REALTEK SEMICONDUCTOR CORP

Test device for testing integrated circuit

Electronic apparatus and control method thereof

Measuring circuit for quantizing variations in circuit operating speed

Circuit operating speed detecting circuit

PLL status detection circuit and method thereof

Circuit having multiple scan modes for testing

Delay difference detection and adjustment device and method

Circuit testing system and circuit testing method

Test circuit and method for reading data from a memory device during memory dump

Device for detecting margin of circuit operating at certain speed

Debugging method executed via scan chain for scan test and related circuitry system

Clock control circuit and method

Reliability detection device and reliability detection method

Clock edge detection device and method

Electronic device test database generating method and electronic device test database generating apparatus

Circuit testing system and circuit testing method

Calibration data generation circuit and associated method

Integrated circuit test method

Method of integrated circuit scan clock domain allocation and machine readable media thereof

Scan clock gating controller and method for performing stuck-at fault test among multiple block circuits

Scan chain designing and circuit testing method

CHEN YING-YEN

Element measurement circuit and method thereof

Estimation apparatus and method for estimating clock skew