Inventor
TAKUBO KENJI
JP27 patents
⚠️ This page may combine multiple inventors who share the name “TAKUBO KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHIMADZU CORP
23 patentsUS7394484B2Jul 1, 2008
Photographic apparatus and photographic method using same
SHIMADZU CORP30 citations90
US10267618B2Apr 23, 2019
Defect detection method and defect detection apparatus
SHIMADZU CORP7 citations83
US11226294B2Jan 18, 2022
Defect inspection apparatus
SHIMADZU CORP2 citations72
US11193887B2Dec 7, 2021
Defect detection method and device
SHIMADZU CORP2 citations72
US11181510B2Nov 23, 2021
Inspection apparatus and inspection method
SHIMADZU CORP2 citations72
US10317190B2Jun 11, 2019
Vibration measurement device
SHIMADZU CORP2 citations72
US11982641B2May 14, 2024
Method and device for examining clinched portion of tubular body
SHIMADZU CORP0 citations62
US10942152B2Mar 9, 2021
Defect inspection device and method
SHIMADZU CORP1 citations62
US10429172B2Oct 1, 2019
Defect detection method and defect detection device
SHIMADZU CORP1 citations62
US7432971B2Oct 7, 2008
In-situ storage image sensor and in-situ storage image pickup apparatus
SHIMADZU CORP3 citations62
US11977032B2May 7, 2024
Displacement measurement device and defect detection device
SHIMADZU CORP0 citations61
US7911610B2Mar 22, 2011
Optical measuring device
SHIMADZU CORP2 citations59
US12345653B2Jul 1, 2025
Defect inspection apparatus
SHIMADZU CORP0 citations52
US12596105B2Apr 7, 2026
Defect inspection apparatus and defect inspection method
SHIMADZU CORP0 citations51
US12360052B2Jul 15, 2025
Defect inspection apparatus and defect inspection method
SHIMADZU CORP0 citations51
US12188769B2Jan 7, 2025
Defect inspection device and defect inspection method
SHIMADZU CORP0 citations51
US12111266B2Oct 8, 2024
Vibration measurement device
SHIMADZU CORP0 citations51
US11815493B2Nov 14, 2023
Defect inspection apparatus and defect inspection method
SHIMADZU CORP0 citations51
US11790513B2Oct 17, 2023
Defect inspection apparatus and defect inspection method
SHIMADZU CORP0 citations51
US11774746B2Oct 3, 2023
Interference image imaging apparatus
SHIMADZU CORP0 citations51
US11391700B2Jul 19, 2022
Defect detection device
SHIMADZU CORP0 citations51
US12099000B2Sep 24, 2024
Defect detection device and defect detection method
SHIMADZU CORP0 citations50
US9429471B2Aug 30, 2016
Photodiode array for spectrometric measurements and spectrometric measurement system
SHIMADZU CORP0 citations48