Inventor
HOSOKI SHIGEYUKI
JP29 patents
Patents
29 patentsUS6875984B2Apr 5, 2005
Bio electron microscope and observation method of specimen
HITACHI LTD105 citations98
US5436448AJul 25, 1995
Surface observing apparatus and method
HITACHI LTD134 citations98
US5416331AMay 16, 1995
Surface atom fabrication method and apparatus
HITACHI LTD69 citations96
US4143292AMar 6, 1979
Field emission cathode of glassy carbon and method of preparation
HITACHI LTD51 citations96
US5767516AJun 16, 1998
Electron microscope and sample observing method using the same
HITACHI LTD20 citations93
US5746826AMay 5, 1998
Method and apparatus for forming microstructure body
HITACHI LTD20 citations92
US5689494ANov 18, 1997
Surface atom fabrication method and apparatus
HITACHI LTD22 citations92
US5585722ADec 17, 1996
Apparatus for measuring physical properties of micro area
HITACHI LTD36 citations92
US5431055AJul 11, 1995
Surface measuring apparatus using a probe microscope
HITACHI LTD33 citations92
US5229607AJul 20, 1993
Combination apparatus having a scanning electron microscope therein
HITACHI LTD47 citations92
US5162653ANov 10, 1992
Scanning tunneling microscope and surface topographic observation method
HITACHI LTD28 citations92
US5144128ASep 1, 1992
Surface microscope and surface microscopy
HITACHI LTD29 citations92
US5140272AAug 18, 1992
Method of semiconductor surface measurment and an apparatus for realizing the same
HITACHI LTD34 citations92
US4912351AMar 27, 1990
Piezoelectric motor
HITACHI LTD38 citations92
US4883959ANov 28, 1989
Scanning surface microscope using a micro-balance device for holding a probe-tip
HITACHI LTD41 citations92
US4379250AApr 5, 1983
Field emission cathode and method of fabricating the same
HITACHI LTD39 citations91
US4841191AJun 20, 1989
Piezoelectric actuator control apparatus
HITACHI LTD46 citations90
US4193013AMar 11, 1980
Cathode for an electron source and a method of producing the same
HITACHI LTD19 citations82
US5036196AJul 30, 1991
Surface microscope
HITACHI LTD14 citations74
US4772817ASep 20, 1988
Cathode mounting a high-frequency piezoelectric chip
HITACHI LTD8 citations74
US4438371AMar 20, 1984
Source of charged particles beam
HITACHI LTD12 citations74
US5256876AOct 26, 1993
Scanning tunnel microscope equipped with scanning electron microscope
HITACHI LTD12 citations73
US5222396AJun 29, 1993
Tunnelling acoustic microscope
HITACHI LTD10 citations73
US5001409AMar 19, 1991
Surface metrological apparatus
HITACHI LTD12 citations73
US4786922ANov 22, 1988
Electron beam recording and reproducing apparatus
HITACHI LTD7 citations73
US5572122ANov 5, 1996
Apparatus including a specimen tilt mechanism for measuring electromagnetic field distribution in the specimen using a focused electron beam
HITACHI LTD3 citations63
US5393983AFeb 28, 1995
Magnetic electron lens and elctron microscope using the same
HITACHI LTD4 citations63
US5698798ADec 16, 1997
Method and apparatus for dynamic observation of specimen
HITACHI LTD3 citations62
US4772821ASep 20, 1988
Apparatus for introducing oxygen gas
HITACHI LTD2 citations62