Inventor

UKON JUICHIRO

JP20 patents

⚠️ This page may combine multiple inventors who share the name “UKON JUICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UKON JUICHIRO

HORIBA LTD

Analytical method for multi-component aqueous solutions and apparatus for the same

Wavelength-scanning mechanism and method for spectrometer

Laser diffraction-type particle size distribution measuring method and apparatus

Infrared microscopic spectrometer

Combustion furnace system for analyzing elements in a sample

Multibeam interferometer for use in a fourier transform spectrometer and a driving device for moving the mirrors used therein

Method and apparatus for determining a peak position of a spectrum

Microscopic spectrometer with auxiliary imaging system

Infrared microscopic spectrometer using the attenuated total reflection method

Reflective optical system for a microscopic spectrometer

Analytical system for remote transmission of data

Microscopic spectrometer

UKON JUICHIRO

Refined oil degradation level measuring instrument and refined oil degradation level measuring method

Optical analyzer and wavelength stabilized laser device for analyzer

ANDO HIDEO

Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method

Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method

NIPPON SOKEN

Apparatus for determining kinds of adsorbates

JOBIN YVON S A

Method for monitoring and/or controlling the status of a plasma in a plasma spectrometer and spectrometer for implementing such a method

UKON CRAFT SCIENCE LTD

Substrate for surface enhanced Raman scattering spectroscopy and devices using same

PROJECT KBF CO LTD

Method and apparatus for measuring gel particle