Inventor · disambiguated record
Jurgen Thiel
Also filed as: THIEL JUERGEN · THIEL JURGEN
7 granted patents·220 citations·filing 1993–2000
88Inventor score
Files withHEIDENHAIN GMBH DR JOHANNES5
Top patents by PatentIndex Score
7 records- 0191US5631736AAbsolute interferometer measuring process and apparatus having a measuring interferometer, control interferometer and tunable laserHEIDENHAIN GMBH DR JOHANNES·Filed 1996·Granted May 20, 1997·103 cites·20 claims
- 0275US5521704AApparatus and method for measuring absolute measurements having two measuring interferometers and a tunable laserFiled 1994·Granted May 28, 1996·36 cites·19 claims
- 0370US6995836B1Angle measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Feb 7, 2006·13 cites·32 claims
- 0470US6265992B1Position measuring system and method for operating a position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 2000·Granted Jul 24, 2001·12 cites·9 claims
- 0562US6535290B1Optical position measuring device with a beam splitterHEIDENHAIN GMBH DR JOHANNES·Filed 1999·Granted Mar 18, 2003·25 cites·18 claims
- 0653US6097318APosition measuring system and method for operating a position measuring systemHEIDENHAIN GMBH DR JOHANNES·Filed 1998·Granted Aug 1, 2000·14 cites·52 claims
- 0745US5596410AInterferometer system and method for controlling the activation of a regulating interferometer in response to an output signalFiled 1993·Granted Jan 21, 1997·17 cites·29 claims
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