Inventor
WANG WEN-YUN
TW14 patents
⚠️ This page may combine multiple inventors who share the name “WANG WEN-YUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
8 patentsUS9436086B2Sep 6, 2016
Anti-reflective layer and method
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US11392045B2Jul 19, 2022
Method for manufacturing semiconductor device and system for performing the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10859924B2Dec 8, 2020
Method for manufacturing semiconductor device and system for performing the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US12308233B2May 20, 2025
Dual critical dimension patterning
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12501658B2Dec 16, 2025
Multi-gate field-effect transistors and methods of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations47
US12507466B2Dec 23, 2025
Multi-gate transistor device including a plurality of gate lines with bridge portion and method for fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations46
US11854854B2Dec 26, 2023
Method for calibrating alignment of wafer and lithography system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations42
US9728469B2Aug 8, 2017
Methods for forming a stress-relieved film stack by applying cutting patterns
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations41
TAIWAN SEMICONDUCTOR MFG
5 patentsUS9245751B2Jan 26, 2016
Anti-reflective layer and method
TAIWAN SEMICONDUCTOR MFG6 citations83
US9017934B2Apr 28, 2015
Photoresist defect reduction system and method
TAIWAN SEMICONDUCTOR MFG2 citations62
US9349622B2May 24, 2016
Method and apparatus for planarization of substrate coatings
TAIWAN SEMICONDUCTOR MFG1 citations51
US9239520B2Jan 19, 2016
Photoresist defect reduction system and method
TAIWAN SEMICONDUCTOR MFG0 citations51
US9110376B2Aug 18, 2015
Photoresist system and method
TAIWAN SEMICONDUCTOR MFG0 citations51