Inventor
ANTLEY RICHARD L
US20 patents
⚠️ This page may combine multiple inventors who share the name “ANTLEY RICHARD L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
16 patentsUS6590225B2Jul 8, 2003
Die testing using top surface test pads
TEXAS INSTRUMENTS INC26 citations96
US8742415B2Jun 3, 2014
Test circuitry coupled to embedded circuit input/output unconnected to pads
TEXAS INSTRUMENTS INC8 citations92
US7569853B2Aug 4, 2009
Test pads on leads unconnected with die pads
TEXAS INSTRUMENTS INC9 citations92
US7124341B2Oct 17, 2006
Integrated circuit having electrically isolatable test circuitry
TEXAS INSTRUMENTS INC17 citations92
US9245812B2Jan 26, 2016
Die with separate functional input, test out, enable input buffers
TEXAS INSTRUMENTS INC4 citations84
US7056752B2Jun 6, 2006
Fabricating a die with test enable circuits between embedded cores
TEXAS INSTRUMENTS INC7 citations82
US8055962B2Nov 8, 2011
Testing IC functional and test circuitry having separate input/output pads
TEXAS INSTRUMENTS INC4 citations74
US7956357B2Jun 7, 2011
Test pads coupled with leads unconnected with die pads
TEXAS INSTRUMENTS INC5 citations74
US7368304B2May 6, 2008
Fabricating die with separate test pads selectively coupled to cores
TEXAS INSTRUMENTS INC5 citations74
US10690717B2Jun 23, 2020
Enable input buffer coupling enable pad, functional circuitry, test circuit
TEXAS INSTRUMENTS INC1 citations73
US10281522B2May 7, 2019
Test circuitry coupling test pad to functional core input pad
TEXAS INSTRUMENTS INC1 citations73
US9472478B2Oct 18, 2016
Die testing using top surface test pads
TEXAS INSTRUMENTS INC0 citations63
US10809295B2Oct 20, 2020
Die testing using top surface test pads
TEXAS INSTRUMENTS INC0 citations52
US7823038B2Oct 26, 2010
Connecting analog response to separate strobed comparator input on IC
TEXAS INSTRUMENTS INC0 citations52
US7587648B2Sep 8, 2009
Integrated circuit having electrically isolatable test circuitry
TEXAS INSTRUMENTS INC0 citations52
US7418643B2Aug 26, 2008
Integrated circuit having electrically isolatable test circuitry
TEXAS INSTRUMENTS INC0 citations52
WHETSEL LEE D
3 patentsUS8941109B2Jan 27, 2015
Test output buffer functional output input, test output, enable input
WHETSEL LEE D7 citations92
US8466464B2Jun 18, 2013
Test and enable circuitry connected between embedded die circuits
WHETSEL LEE D9 citations92
US8168970B2May 1, 2012
Die having embedded circuitry with test and test enable circuitry
WHETSEL LEE D7 citations92