P

Inventor

ANDREWS MIKE

US49 patents
⚠️ This page may combine multiple inventors who share the name “ANDREWS MIKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CASCADE MICROTECH INC

27 patents
US6815963B2Nov 9, 2004

Probe for testing a device under test

CASCADE MICROTECH INC80 citations99
US7161363B2Jan 9, 2007

Probe for testing a device under test

CASCADE MICROTECH INC64 citations98
US6806724B2Oct 19, 2004

Probe for combined signals

CASCADE MICROTECH INC104 citations98
US6724205B1Apr 20, 2004

Probe for combined signals

CASCADE MICROTECH INC110 citations98
US7271603B2Sep 18, 2007

Shielded probe for testing a device under test

CASCADE MICROTECH INC51 citations96
US7233160B2Jun 19, 2007

Wafer probe

CASCADE MICROTECH INC39 citations96
US7898273B2Mar 1, 2011

Probe for testing a device under test

CASCADE MICROTECH INC10 citations92
US7688097B2Mar 30, 2010

Wafer probe

CASCADE MICROTECH INC12 citations92
US7501842B2Mar 10, 2009

Shielded probe for testing a device under test

CASCADE MICROTECH INC11 citations92
US7498829B2Mar 3, 2009

Shielded probe for testing a device under test

CASCADE MICROTECH INC12 citations92
US7482823B2Jan 27, 2009

Shielded probe for testing a device under test

CASCADE MICROTECH INC11 citations92
US7456646B2Nov 25, 2008

Wafer probe

CASCADE MICROTECH INC11 citations92
US7453276B2Nov 18, 2008

Probe for combined signals

CASCADE MICROTECH INC16 citations92
US7436194B2Oct 14, 2008

Shielded probe with low contact resistance for testing a device under test

CASCADE MICROTECH INC10 citations92
US7417446B2Aug 26, 2008

Probe for combined signals

CASCADE MICROTECH INC13 citations92
US7304488B2Dec 4, 2007

Shielded probe for high-frequency testing of a device under test

CASCADE MICROTECH INC19 citations92
US7285969B2Oct 23, 2007

Probe for combined signals

CASCADE MICROTECH INC11 citations92
US7761983B2Jul 27, 2010

Method of assembling a wafer probe

CASCADE MICROTECH INC10 citations84
US7609077B2Oct 27, 2009

Differential signal probe with integral balun

CASCADE MICROTECH INC13 citations84
US7518387B2Apr 14, 2009

Shielded probe for testing a device under test

CASCADE MICROTECH INC9 citations84
US7495461B2Feb 24, 2009

Wafer probe

CASCADE MICROTECH INC9 citations84
US7489149B2Feb 10, 2009

Shielded probe for testing a device under test

CASCADE MICROTECH INC8 citations84
US7205784B2Apr 17, 2007

Probe for combined signals

CASCADE MICROTECH INC5 citations73
US7075320B2Jul 11, 2006

Probe for combined signals

CASCADE MICROTECH INC4 citations73
US7394269B2Jul 1, 2008

Probe for testing a device under test

CASCADE MICROTECH INC2 citations63
US7352258B2Apr 1, 2008

Waveguide adapter for probe assembly having a detachable bias tee

CASCADE MICROTECH INC5 citations63
US7046023B2May 16, 2006

Probe for combined signals

CASCADE MICROTECH INC1 citations62

REEBOK INT LTD

10 patents

INNOVATIVE CONCEPTS IN ENTERTAINMENT INC

6 patents

VESTUTI RICARDO

2 patents

SHARP LAB OF AMERICA INC

1 patent

MATTEL INC

1 patent

INTEL CORP

1 patent

HIPPELY KEITH

1 patent