Inventor
HAYDEN LEONARD
US23 patents
⚠️ This page may combine multiple inventors who share the name “HAYDEN LEONARD”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CASCADE MICROTECH INC
22 patentsUS6815963B2Nov 9, 2004
Probe for testing a device under test
CASCADE MICROTECH INC80 citations99
US7161363B2Jan 9, 2007
Probe for testing a device under test
CASCADE MICROTECH INC64 citations98
US6806724B2Oct 19, 2004
Probe for combined signals
CASCADE MICROTECH INC104 citations98
US6724205B1Apr 20, 2004
Probe for combined signals
CASCADE MICROTECH INC110 citations98
US7233160B2Jun 19, 2007
Wafer probe
CASCADE MICROTECH INC39 citations96
US7688097B2Mar 30, 2010
Wafer probe
CASCADE MICROTECH INC12 citations92
US7482823B2Jan 27, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC11 citations92
US7456646B2Nov 25, 2008
Wafer probe
CASCADE MICROTECH INC11 citations92
US7453276B2Nov 18, 2008
Probe for combined signals
CASCADE MICROTECH INC16 citations92
US7436194B2Oct 14, 2008
Shielded probe with low contact resistance for testing a device under test
CASCADE MICROTECH INC10 citations92
US7417446B2Aug 26, 2008
Probe for combined signals
CASCADE MICROTECH INC13 citations92
US7304488B2Dec 4, 2007
Shielded probe for high-frequency testing of a device under test
CASCADE MICROTECH INC19 citations92
US7285969B2Oct 23, 2007
Probe for combined signals
CASCADE MICROTECH INC11 citations92
US7761983B2Jul 27, 2010
Method of assembling a wafer probe
CASCADE MICROTECH INC10 citations84
US7518387B2Apr 14, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC9 citations84
US7495461B2Feb 24, 2009
Wafer probe
CASCADE MICROTECH INC9 citations84
US7489149B2Feb 10, 2009
Shielded probe for testing a device under test
CASCADE MICROTECH INC8 citations84
US7205784B2Apr 17, 2007
Probe for combined signals
CASCADE MICROTECH INC5 citations73
US7075320B2Jul 11, 2006
Probe for combined signals
CASCADE MICROTECH INC4 citations73
US7908107B2Mar 15, 2011
Line-reflect-reflect match calibration
CASCADE MICROTECH INC3 citations63
US7352258B2Apr 1, 2008
Waveguide adapter for probe assembly having a detachable bias tee
CASCADE MICROTECH INC5 citations63
US7046023B2May 16, 2006
Probe for combined signals
CASCADE MICROTECH INC1 citations62