Inventor
BURLISON PHILLIP D
US13 patents
⚠️ This page may combine multiple inventors who share the name “BURLISON PHILLIP D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INOVYS CORP
5 patentsUS7032145B1Apr 18, 2006
System for dynamic re-allocation of test pattern data for parallel and serial test data patterns
INOVYS CORP21 citations92
US6839648B1Jan 4, 2005
Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment
INOVYS CORP12 citations83
US7013417B1Mar 14, 2006
Dynamically reconfigurable precision signal delay test system for automatic test equipment
INOVYS CORP12 citations82
US6591213B1Jul 8, 2003
Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment
INOVYS CORP12 citations73
US7114114B1Sep 26, 2006
Dynamically reconfigurable precision signal delay test system for automatic test equipment
INOVYS CORP6 citations71
LTX CORP
3 patentsVERIGY PTE LTD SINGAPORE
3 patentsUS7865788B2Jan 4, 2011
Dynamic mask memory for serial scan testing
VERIGY PTE LTD SINGAPORE8 citations82
US7650547B2Jan 19, 2010
Apparatus for locating a defect in a scan chain while testing digital logic
VERIGY PTE LTD SINGAPORE9 citations82
US8006149B2Aug 23, 2011
System and method for device performance characterization in physical and logical domains with AC SCAN testing
VERIGY PTE LTD SINGAPORE5 citations60