P

Inventor

TOMOMATSU YOSHIFUMI

JP25 patents
⚠️ This page may combine multiple inventors who share the name “TOMOMATSU YOSHIFUMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITSUBISHI ELECTRIC CORP

22 patents
US6734497B2May 11, 2004

Insulated gate bipolar transistor, semiconductor device, method of manufacturing insulated-gate bipolar transistor, and method of manufacturing semiconductor device

MITSUBISHI ELECTRIC CORP34 citations92
US6633473B1Oct 14, 2003

Overcurrent control circuit of power semiconductor device

MITSUBISHI ELECTRIC CORP39 citations92
US6541826B2Apr 1, 2003

Field effect semiconductor device and its production method

MITSUBISHI ELECTRIC CORP26 citations92
US6472693B1Oct 29, 2002

Semiconductor device and method of manufacturing the same

MITSUBISHI ELECTRIC CORP21 citations92
US7211837B2May 1, 2007

Insulated gate semiconductor device

MITSUBISHI ELECTRIC CORP20 citations91
US6781200B2Aug 24, 2004

Insulated gate semiconductor device for realizing low gate capacity and a low short-circuit current

MITSUBISHI ELECTRIC CORP31 citations91
US5729032AMar 17, 1998

Field effect type semiconductor device and manufacturing method thereof

MITSUBISHI ELECTRIC CORP37 citations91
US6229196B1May 8, 2001

Semiconductor device and fabrication method thereof

MITSUBISHI ELECTRIC CORP20 citations85
US7705398B2Apr 27, 2010

Semiconductor device preventing recovery breakdown and manufacturing method thereof

MITSUBISHI ELECTRIC CORP9 citations83
US7986003B2Jul 26, 2011

Semiconductor device and manufacturing method thereof

MITSUBISHI ELECTRIC CORP16 citations80
US6486523B2Nov 26, 2002

Power semiconductor device with temperature detector

MITSUBISHI ELECTRIC CORP12 citations74
US5451531ASep 19, 1995

Method of fabricating an insulated gate semiconductor device

MITSUBISHI ELECTRIC CORP14 citations74
US5355003AOct 11, 1994

Semiconductor device having stable breakdown voltage in wiring area

MITSUBISHI ELECTRIC CORP14 citations74
US5321281AJun 14, 1994

Insulated gate semiconductor device and method of fabricating same

MITSUBISHI ELECTRIC CORP15 citations74
US5945691AAug 31, 1999

Semiconductor device for preventing destruction during a turn-off state

MITSUBISHI ELECTRIC CORP11 citations69
US7768101B2Aug 3, 2010

Semiconductor device having an insulated gate bipolar transistor and a free wheel diode

MITSUBISHI ELECTRIC CORP5 citations63
US6680513B2Jan 20, 2004

Semiconductor device

MITSUBISHI ELECTRIC CORP4 citations63
US6683348B1Jan 27, 2004

Insulated gate bipolar semiconductor device transistor with a ladder shaped emitter

MITSUBISHI ELECTRIC CORP1 citations50
US6709914B2Mar 23, 2004

Manufacturing process of pn junction diode device and pn junction diode device

MITSUBISHI ELECTRIC CORP1 citations49
US5489788AFeb 6, 1996

Insulated gate semiconductor device with improved short-circuit tolerance

MITSUBISHI ELECTRIC CORP0 citations42
US9972618B2May 15, 2018

Semiconductor device

MITSUBISHI ELECTRIC CORP0 citations39
US10347725B2Jul 9, 2019

Semiconductor device that facilitates a reduction in the occurrences of cracking in a semiconductor layer accompanying thermal stress

MITSUBISHI ELECTRIC CORP0 citations30

TAKAHASHI TETSUO

1 patent

SUZUKI KENJI

1 patent

NAKANO SEIYA

1 patent