Inventor

MADHAVAN SRIRAM

US13 patents

⚠️ This page may combine multiple inventors who share the name “MADHAVAN SRIRAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

GLOBALFOUNDRIES INC

4 patents

US7880229B2Feb 1, 2011

Body tie test structure for accurate body effect measurement

GLOBALFOUNDRIES INC2 citations62

US10372871B2Aug 6, 2019

IC layout post-decomposition mask allocation optimization

GLOBALFOUNDRIES INC0 citations41

US10055535B2Aug 21, 2018

Method, system and program product for identifying anomalies in integrated circuit design layouts

GLOBALFOUNDRIES INC0 citations36

US10095826B2Oct 9, 2018

Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysis

GLOBALFOUNDRIES INC0 citations32

CUMMINS INC

2 patents

US10968803B2Apr 6, 2021

Systems and methods for idle fuel economy mode

CUMMINS INC0 citations55

US10392990B2Aug 27, 2019

Systems and methods for idle fuel economy mode

CUMMINS INC0 citations45

CYPRESS SEMICONDUCTOR CORP

1 patent

US6534378B1Mar 18, 2003

Method for forming an integrated circuit device

CYPRESS SEMICONDUCTOR CORP31 citations90

ADVANCED MICRO DEVICES INC

1 patent

US7804317B1Sep 28, 2010

Test device for determining charge damage to a transistor

ADVANCED MICRO DEVICES INC11 citations82

WANG LYNN

1 patent

US8918745B2Dec 23, 2014

Stitch insertion for reducing color density differences in double patterning technology (DPT)

WANG LYNN9 citations81

WANG LYNN T

1 patent

US8516407B1Aug 20, 2013

Methods for quantitatively evaluating the quality of double patterning technology-compliant layouts

WANG LYNN T9 citations80

MADHAVAN SRIRAM

1 patent

US8293606B2Oct 23, 2012

Body tie test structure for accurate body effect measurement

MADHAVAN SRIRAM4 citations57

MUDDU SWAMY

1 patent

US8745553B2Jun 3, 2014

Method and apparatus for applying post graphic data system stream enhancements

MUDDU SWAMY0 citations45

PATHAK PIYUSH

1 patent

US8656336B2Feb 18, 2014

Pattern based method for identifying design for manufacturing improvement in a semiconductor device

PATHAK PIYUSH0 citations42