Inventor
CHO YONG JAI
KR16 patents
⚠️ This page may combine multiple inventors who share the name “CHO YONG JAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KOREA RES INST STANDARDS & SCI
8 patentsUS11493433B2Nov 8, 2022
Normal incidence ellipsometer and method for measuring optical properties of sample by using same
KOREA RES INST STANDARDS & SCI2 citations71
US10921241B2Feb 16, 2021
Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method
KOREA RES INST STANDARDS & SCI2 citations71
US9581498B2Feb 28, 2017
Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same
KOREA RES INST STANDARDS & SCI4 citations71
US10317334B2Jun 11, 2019
Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same
KOREA RES INST STANDARDS & SCI2 citations61
US10145785B2Dec 4, 2018
Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same
KOREA RES INST STANDARDS & SCI1 citations51
US12152982B2Nov 26, 2024
Device and method for multi-reflection solution immersed silicon-based microchannel measurement
KOREA RES INST STANDARDS & SCI0 citations50
US11719624B2Aug 8, 2023
Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon
KOREA RES INST STANDARDS & SCI0 citations50
US10458901B2Oct 29, 2019
Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution
KOREA RES INST STANDARDS & SCI0 citations40
CHO HYUN MO
3 patentsUS8940538B2Jan 27, 2015
Apparatus and method for quantifying binding and dissociation kinetics of molecular interactions
CHO HYUN MO5 citations67
US8705039B2Apr 22, 2014
Surface plasmon resonance sensor using vertical illuminating focused-beam ellipsometer
CHO HYUN MO3 citations59
US8705033B2Apr 22, 2014
Multi-channel surface plasmon resonance sensor using beam profile ellipsometry
CHO HYUN MO1 citations49
CHO YONG JAI
3 patentsUS8830463B2Sep 9, 2014
Rotating-element ellipsometer and method for measuring properties of the sample using the same
CHO YONG JAI5 citations67
US8447546B2May 21, 2013
Measurement of Fourier coefficients using integrating photometric detector
CHO YONG JAI4 citations60
US8300221B2Oct 30, 2012
Minute measuring instrument for high speed and large area and method thereof
CHO YONG JAI4 citations60