Inventor
CHEGAL WON
KR15 patents
⚠️ This page may combine multiple inventors who share the name “CHEGAL WON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KOREA RES INST STANDARDS & SCI
8 patentsUS11493433B2Nov 8, 2022
Normal incidence ellipsometer and method for measuring optical properties of sample by using same
KOREA RES INST STANDARDS & SCI2 citations71
US10921241B2Feb 16, 2021
Oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device and measurement method
KOREA RES INST STANDARDS & SCI2 citations71
US9581498B2Feb 28, 2017
Rotating-element spectroscopic ellipsometer and method for measurement precision prediction of rotating-element spectroscopic ellipsometer, recording medium storing program for executing the same, and computer program stored in medium for executing the same
KOREA RES INST STANDARDS & SCI4 citations71
US10317334B2Jun 11, 2019
Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same
KOREA RES INST STANDARDS & SCI2 citations61
US10145785B2Dec 4, 2018
Optical element rotation type Mueller-matrix ellipsometer and method for measuring Mueller-matrix of sample using the same
KOREA RES INST STANDARDS & SCI1 citations51
US12152982B2Nov 26, 2024
Device and method for multi-reflection solution immersed silicon-based microchannel measurement
KOREA RES INST STANDARDS & SCI0 citations50
US11719624B2Aug 8, 2023
Liquid immersion micro-channel measurement device and measurement method which are based on trapezoidal incident structure prism incident-type silicon
KOREA RES INST STANDARDS & SCI0 citations50
US10458901B2Oct 29, 2019
Apparatus and method for simultaneously measuring characteristics of molecular junctions and refractive index of buffer solution
KOREA RES INST STANDARDS & SCI0 citations40