Inventor
BAO XUSHENG
SG20 patents
⚠️ This page may combine multiple inventors who share the name “BAO XUSHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
STATS CHIPPAC LTD
8 patentsUS7642128B1Jan 5, 2010
Semiconductor device and method of forming a vertical interconnect structure for 3-D FO-WLCSP
STATS CHIPPAC LTD144 citations99
US9401331B2Jul 26, 2016
Semiconductor device and method of forming a vertical interconnect structure for 3-D FO-WLCSP
STATS CHIPPAC LTD5 citations84
US9293401B2Mar 22, 2016
Semiconductor device and method for forming a low profile embedded wafer level ball grid array molded laser package (EWLP-MLP)
STATS CHIPPAC LTD11 citations84
US7989356B2Aug 2, 2011
Semiconductor device and method of forming enhanced UBM structure for improving solder joint reliability
STATS CHIPPAC LTD18 citations83
US9437552B2Sep 6, 2016
Semiconductor device and method of forming insulating layer around semiconductor die
STATS CHIPPAC LTD0 citations52
US8878359B2Nov 4, 2014
Semiconductor device and method of forming insulating layer around semiconductor die
STATS CHIPPAC LTD0 citations52
US9397058B2Jul 19, 2016
Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration
STATS CHIPPAC LTD1 citations50
US9478485B2Oct 25, 2016
Semiconductor device and method of stacking semiconductor die on a fan-out WLCSP
STATS CHIPPAC LTD0 citations31
LIN YAOJIAN
2 patentsCHOW SENG GUAN
2 patentsUS9252172B2Feb 2, 2016
Semiconductor device and method of forming EWLB semiconductor package with vertical interconnect structure and cavity region
CHOW SENG GUAN34 citations92
US9171769B2Oct 27, 2015
Semiconductor device and method of forming openings through encapsulant to reduce warpage and stress on semiconductor package
CHOW SENG GUAN2 citations61
BAO XUSHENG
2 patentsUS8963326B2Feb 24, 2015
Semiconductor device and method of forming patterned repassivation openings between RDL and UBM to reduce adverse effects of electro-migration
BAO XUSHENG13 citations80
US9142522B2Sep 22, 2015
Semiconductor device and method of forming RDL under bump for electrical connection to enclosed bump
BAO XUSHENG1 citations48