P

Inventor

BANZHOF HELMUT

DE10 patents
⚠️ This page may combine multiple inventors who share the name “BANZHOF HELMUT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEGRATED CIRCUIT TESTING

4 patents
US8049180B2Nov 1, 2011

Achromatic mass separator

INTEGRATED CIRCUIT TESTING4 citations62
US7763866B2Jul 27, 2010

Charged particle beam device with aperture

INTEGRATED CIRCUIT TESTING5 citations62
US7282711B2Oct 16, 2007

Multiple electron beam device

INTEGRATED CIRCUIT TESTING6 citations58
US7838830B2Nov 23, 2010

Charged particle beam apparatus and method for operating a charged particle beam apparatus

INTEGRATED CIRCUIT TESTING1 citations51

BANZHOF HELMUT

2 patents
US8294096B2Oct 23, 2012

Charged particle beam device and a method of operating a charged particle beam device

BANZHOF HELMUT2 citations56
US8735847B2May 27, 2014

High resolution gas field ion column with reduced sample load

BANZHOF HELMUT0 citations37

ALMOGY GILAD

1 patent
US9153413B2Oct 6, 2015

Multi-beam scanning electron beam device and methods of using the same

ALMOGY GILAD57 citations96

JEOL LTD

1 patent
US7427765B2Sep 23, 2008

Electron beam column for writing shaped electron beams

JEOL LTD6 citations72

BULLER BENYAMIN

1 patent
US7800075B2Sep 21, 2010

Multi-function module for an electron beam column

BULLER BENYAMIN4 citations60

ADAMEC PAVEL

1 patent
US8164067B2Apr 24, 2012

Arrangement and method for the contrast improvement in a charged particle beam device for inspecting a specimen

ADAMEC PAVEL3 citations59