Inventor
ARIELI YOEL
IL41 patents
⚠️ This page may combine multiple inventors who share the name “ARIELI YOEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADOM ADVANCED OPTICAL TECH LTD
18 patentsUS9757027B2Sep 12, 2017
System and method for performing tear film structure measurement and evaporation rate measurements
ADOM ADVANCED OPTICAL TECH LTD6 citations82
US10054419B2Aug 21, 2018
Method for analyzing an object using a combination of long and short coherence interferometry
ADOM ADVANCED OPTICAL TECH LTD2 citations73
US10024650B2Jul 17, 2018
System for analyzing optical properties of an object
ADOM ADVANCED OPTICAL TECH LTD4 citations73
US10456029B2Oct 29, 2019
Apparatus and method for detecting surface topography
ADOM ADVANCED OPTICAL TECH LTD2 citations71
US9833139B1Dec 5, 2017
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD3 citations71
US9696134B2Jul 4, 2017
System for performing dual path, two-dimensional optical coherence tomography (OCT)
ADOM ADVANCED OPTICAL TECH LTD3 citations69
US10612913B2Apr 7, 2020
Apparatus and methods for performing tomography and/or topography measurements on an object
ADOM ADVANCED OPTICAL TECH LTD1 citations62
US11116394B2Sep 14, 2021
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD0 citations60
US10415954B2Sep 17, 2019
Method for analyzing an object
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10330462B2Jun 25, 2019
System for analyzing optical properties of an object
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10119903B2Nov 6, 2018
Interferometric ellipsometry and method using conical refraction
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10054429B2Aug 21, 2018
System for tomography and/or topography measurements of a layered objects
ADOM ADVANCED OPTICAL TECH LTD0 citations52
US10024783B2Jul 17, 2018
Interferometric ellipsometry and method using conical refraction
ADOM ADVANCED OPTICAL TECH LTD1 citations52
US12023099B2Jul 2, 2024
System and method for performing tear film structure measurement
ADOM ADVANCED OPTICAL TECH LTD0 citations50
US11965777B2Apr 23, 2024
Apparatus and methods for calibrating optical measurements
ADOM ADVANCED OPTICAL TECH LTD0 citations50
US10288407B2May 14, 2019
System for performing dual path, two-dimensional optical coherence tomography (OCT)
ADOM ADVANCED OPTICAL TECH LTD0 citations48
US10274371B2Apr 30, 2019
Spectral imaging camera and applications
ADOM ADVANCED OPTICAL TECH LTD0 citations48
US12213733B2Feb 4, 2025
System and method for detecting physical characteristics of a multilayered tissue of a subject
ADOM ADVANCED OPTICAL TECH LTD0 citations43
FREEDMAN BARAK
3 patentsUS8493496B2Jul 23, 2013
Depth mapping using projected patterns
FREEDMAN BARAK183 citations97
US8494252B2Jul 23, 2013
Depth mapping using optical elements having non-uniform focal characteristics
FREEDMAN BARAK67 citations97
US8150142B2Apr 3, 2012
Depth mapping using projected patterns
FREEDMAN BARAK100 citations96
ICOS VISION SYSTEMS NV
3 patentsUS7327470B2Feb 5, 2008
Spatial and spectral wavefront analysis and measurement
ICOS VISION SYSTEMS NV14 citations92
US7609388B2Oct 27, 2009
Spatial wavefront analysis and 3D measurement
ICOS VISION SYSTEMS NV28 citations86
US7542144B2Jun 2, 2009
Spatial and spectral wavefront analysis and measurement
ICOS VISION SYSTEMS NV4 citations56
ADDON OPTICS LTD
3 patentsUS9995948B2Jun 12, 2018
Adhesive optical film to convert an eyeglass lens to a progressive lens
ADDON OPTICS LTD17 citations90
US10712591B2Jul 14, 2020
Adhesive optical film to convert an eyeglass lens to a progressive lens
ADDON OPTICS LTD4 citations69
US11719959B2Aug 8, 2023
Optical element for converting a single-vision lens to a progressive lens
ADDON OPTICS LTD0 citations59
ARIELI YOEL
3 patentsUS9198640B2Dec 1, 2015
System and methods for providing information related to a tissue region of a subject
ARIELI YOEL2 citations58
US9250133B2Feb 2, 2016
Spectral imaging camera and applications
ARIELI YOEL0 citations45
US8319975B2Nov 27, 2012
Methods and apparatus for wavefront manipulations and improved 3-D measurements
ARIELI YOEL0 citations42