P

Inventor

MANN HANS-JUERGEN

DE136 patents
⚠️ This page may combine multiple inventors who share the name “MANN HANS-JUERGEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZEISS CARL SMT AG

24 patents
US7414781B2Aug 19, 2008

Catoptric objectives and systems using catoptric objectives

ZEISS CARL SMT AG64 citations98
US7085075B2Aug 1, 2006

Projection objectives including a plurality of mirrors with lenses ahead of mirror M3

ZEISS CARL SMT AG82 citations98
US6894834B2May 17, 2005

Objective with pupil obscuration

ZEISS CARL SMT AG90 citations98
US6710917B2Mar 23, 2004

8-mirror microlithography projection objective

ZEISS CARL SMT AG88 citations97
US6927901B2Aug 9, 2005

Reflective projection lens for EUV-photolithography

ZEISS CARL SMT AG54 citations96
US7385756B2Jun 10, 2008

Catadioptric projection objective

ZEISS CARL SMT AG42 citations93
US7375798B2May 20, 2008

Projection system for EUV lithography

ZEISS CARL SMT AG25 citations93
US7355678B2Apr 8, 2008

Projection system for EUV lithography

ZEISS CARL SMT AG25 citations93
US7186983B2Mar 6, 2007

Illumination system particularly for microlithography

ZEISS CARL SMT AG21 citations93
US7151592B2Dec 19, 2006

Projection system for EUV lithography

ZEISS CARL SMT AG34 citations93
US6985210B2Jan 10, 2006

Projection system for EUV lithography

ZEISS CARL SMT AG34 citations93
US7199922B2Apr 3, 2007

Reflective projection lens for EUV-photolithography

ZEISS CARL SMT AG26 citations92
US7177076B2Feb 13, 2007

8-mirror microlithography projection objective

ZEISS CARL SMT AG19 citations92
US6867913B2Mar 15, 2005

6-mirror microlithography projection objective

ZEISS CARL SMT AG31 citations92
US7623620B2Nov 24, 2009

Reflective X-ray microscope and inspection system for examining objects with wavelengths <100 nm

ZEISS CARL SMT AG26 citations91
US7463422B2Dec 9, 2008

Projection exposure apparatus

ZEISS CARL SMT AG19 citations91
US7869138B2Jan 11, 2011

Projection objective and projection exposure apparatus with negative back focus of the entry pupil

ZEISS CARL SMT AG7 citations84
US7712905B2May 11, 2010

Imaging system with mirror group

ZEISS CARL SMT AG9 citations84
US7348565B2Mar 25, 2008

Illumination system particularly for microlithography

ZEISS CARL SMT AG10 citations84
US7477355B2Jan 13, 2009

Projection exposure apparatus and projection optical system

ZEISS CARL SMT AG10 citations83
US7372539B2May 13, 2008

Method for distortion correction in a microlithographic projection exposure apparatus

ZEISS CARL SMT AG10 citations83
US7869122B2Jan 11, 2011

Catadioptric projection objective

ZEISS CARL SMT AG5 citations74
US7456408B2Nov 25, 2008

Illumination system particularly for microlithography

ZEISS CARL SMT AG6 citations74
US7372624B2May 13, 2008

8-mirror microlithography projection objective

ZEISS CARL SMT AG5 citations73

ZEISS CARL SMT GMBH

11 patents

MANN HANS-JUERGEN

7 patents

SHAFER DAVID

2 patents

CHAN DANNY

2 patents

CARL ZEISS SEMICONDUCTOR

1 patent

ZEISS STIFTUNG

1 patent

ZELLNER JOHANNES

1 patent

TRENKLER JOHANN

1 patent

Showing the top 50 of 136 patents by PatentIndex Score.