P

Inventor

PAONE PHIL C

US69 patents
⚠️ This page may combine multiple inventors who share the name “PAONE PHIL C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

41 patents
US7442583B2Oct 28, 2008

Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable

IBM21 citations93
US7336095B2Feb 26, 2008

Changing chip function based on fuse states

IBM31 citations93
US7268577B2Sep 11, 2007

Changing chip function based on fuse states

IBM21 citations93
US10418094B2Sep 17, 2019

Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cells

IBM6 citations84
US10236050B2Mar 19, 2019

Optimizing data approximation analysis using low power circuitry

IBM4 citations84
US10224089B2Mar 5, 2019

Optimizing data approximation analysis using low bower circuitry

IBM4 citations84
US10043568B1Aug 7, 2018

Optimizing data approximation analysis using low power circuitry

IBM11 citations84
US10037792B1Jul 31, 2018

Optimizing data approximation analysis using low power circuitry

IBM11 citations84
US9916890B1Mar 13, 2018

Predicting data correlation using multivalued logical outputs in static random access memory (SRAM) storage cells

IBM10 citations84
US7550789B2Jun 23, 2009

Using electrically programmable fuses to hide architecture, prevent reverse engineering, and make a device inoperable

IBM13 citations84
US7551470B2Jun 23, 2009

Non volatile memory RAD-hard (NVM-rh) system

IBM18 citations84
US10598710B2Mar 24, 2020

Cognitive analysis using applied analog circuits

IBM4 citations73
US10304522B2May 28, 2019

Method for low power operation and test using DRAM device

IBM6 citations73
US9864006B1Jan 9, 2018

Generating a unique die identifier for an electronic chip

IBM4 citations73
US9646712B1May 9, 2017

Implementing eFuse visual security of stored data using EDRAM

IBM2 citations73
US9583403B2Feb 28, 2017

Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage

IBM2 citations73
US9514841B1Dec 6, 2016

Implementing eFuse visual security of stored data using EDRAM

IBM4 citations73
US9245884B1Jan 26, 2016

Structure for metal oxide semiconductor capacitor

IBM5 citations73
US8921199B1Dec 30, 2014

Precision IC resistor fabrication

IBM5 citations73
US9053889B2Jun 9, 2015

Electronic fuse cell and array

IBM5 citations71
US11061645B2Jul 13, 2021

Optimizing data approximation analysis using low power circuitry

IBM0 citations63
US9252083B2Feb 2, 2016

Semiconductor chip with power gating through silicon vias

IBM2 citations63
US9099164B2Aug 4, 2015

Capacitor backup for SRAM

IBM3 citations63
US9059307B1Jun 16, 2015

Method of implementing buried FET below and beside FinFET on bulk substrate

IBM2 citations63
US9040406B2May 26, 2015

Semiconductor chip with power gating through silicon vias

IBM2 citations63
US8953365B2Feb 10, 2015

Capacitor backup for SRAM

IBM3 citations63
US8754499B1Jun 17, 2014

Semiconductor chip with power gating through silicon vias

IBM3 citations63
US8735975B2May 27, 2014

Implementing semiconductor soc with metal via gate node high performance stacked transistors

IBM2 citations63
US11551101B2Jan 10, 2023

Real time cognitive reasoning using a circuit with varying confidence level alerts

IBM0 citations62
US11526768B2Dec 13, 2022

Real time cognitive reasoning using a circuit with varying confidence level alerts

IBM0 citations62
US9378836B1Jun 28, 2016

Sensing circuit for a non-volatile memory cell having two complementary memory transistors

IBM2 citations62
US7532057B2May 12, 2009

Electrically programmable fuse sense circuit

IBM4 citations62
US10802062B2Oct 13, 2020

Cognitive analysis using applied analog circuits

IBM0 citations52
US10670642B2Jun 2, 2020

Real time cognitive monitoring of correlations between variables

IBM0 citations52
US10663502B2May 26, 2020

Real time cognitive monitoring of correlations between variables

IBM0 citations52
US10236887B2Mar 19, 2019

Generating a unique die identifier for an electronic chip

IBM0 citations52
US10121530B2Nov 6, 2018

Implementing eFuse visual security of stored data using EDRAM

IBM0 citations52
US10090063B2Oct 2, 2018

System for testing charge trap memory cells

IBM0 citations52
US9953720B2Apr 24, 2018

Implementing hidden security key in eFuses

IBM0 citations52
US9721856B2Aug 1, 2017

Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage

IBM0 citations52
US9666305B1May 30, 2017

System for testing charge trap memory cells

IBM0 citations52

ERICKSON KARL R

8 patents

PAONE PHIL C

1 patent

Showing the top 50 of 69 patents by PatentIndex Score.