Inventor
AMEMIYA HIROSHI
JP12 patents
⚠️ This page may combine multiple inventors who share the name “AMEMIYA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
6 patentsUS6249132B1Jun 19, 2001
Inspection methods and apparatuses
TOKYO ELECTRON LTD27 citations92
US6169409B1Jan 2, 2001
Low-temperature wafer testing method and prober
TOKYO ELECTRON LTD43 citations92
US6762616B2Jul 13, 2004
Probe system
TOKYO ELECTRON LTD26 citations91
US7385386B2Jun 10, 2008
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
TOKYO ELECTRON LTD6 citations74
US6958618B2Oct 25, 2005
Transporting mechanism, movable probe card transporting apparatus using transporting mechanism, and prober
TOKYO ELECTRON LTD8 citations74
US12106997B2Oct 1, 2024
Test device, change kit, and method of exchanging change kit
TOKYO ELECTRON LTD0 citations61
TOKYO SHIBAURA ELECTRIC CO
4 patentsUS4063236ADec 13, 1977
Analog-digital converter
TOKYO SHIBAURA ELECTRIC CO23 citations78
US3973130AAug 3, 1976
Apparatus for recording information on a film
TOKYO SHIBAURA ELECTRIC CO9 citations73
US4125023ANov 14, 1978
Temperature-measuring apparatus
TOKYO SHIBAURA ELECTRIC CO17 citations71
US4081800AMar 28, 1978
Analog-to-digital converter
TOKYO SHIBAURA ELECTRIC CO11 citations69