Inventor
RICHARDSON NEIL
US35 patents
⚠️ This page may combine multiple inventors who share the name “RICHARDSON NEIL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
5 patentsUS6576923B2Jun 10, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP117 citations97
US6509197B1Jan 21, 2003
Inspectable buried test structures and methods for inspecting the same
KLA TENCOR CORP146 citations97
US6445199B1Sep 3, 2002
Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures
KLA TENCOR CORP106 citations97
US5869833AFeb 9, 1999
Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments
KLA TENCOR CORP78 citations95
US6211518B1Apr 3, 2001
Electron beam dose control for scanning electron microscopy and critical dimension measurement instruments
KLA TENCOR CORP25 citations92
KLA TENCOR
4 patentsUS6633174B1Oct 14, 2003
Stepper type test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR195 citations99
US6636064B1Oct 21, 2003
Dual probe test structures for semiconductor integrated circuits
KLA TENCOR127 citations98
US6524873B1Feb 25, 2003
Continuous movement scans of test structures on semiconductor integrated circuits
KLA TENCOR102 citations98
US6528818B1Mar 4, 2003
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR60 citations96
BANKVAULT PTY LTD
4 patentsUS11663025B2May 30, 2023
Maintenance of and caching of suspended virtual computers in a pool of suspended virtual computers
BANKVAULT PTY LTD0 citations55
US10922445B2Feb 16, 2021
Computing systems and methods
BANKVAULT PTY LTD1 citations48
US12526272B2Jan 13, 2026
Method and system for verification of identify of a user
BANKVAULT PTY LTD0 citations46
US11893145B2Feb 6, 2024
Virtual machines—computer implemented security methods and systems
BANKVAULT PTY LTD0 citations46
KLA TENCOR TECH CORP
3 patentsUS6921672B2Jul 26, 2005
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR TECH CORP59 citations96
US6627884B2Sep 30, 2003
Simultaneous flooding and inspection for charge control in an electron beam inspection machine
KLA TENCOR TECH CORP29 citations92
US7569834B1Aug 4, 2009
High resolution charged particle projection lens array using magnetic elements
KLA TENCOR TECH CORP7 citations74
SCHLUMBERGER TECHNOLOGIES INC
3 patentsUS5140164AAug 18, 1992
Ic modification with focused ion beam system
SCHLUMBERGER TECHNOLOGIES INC78 citations95
US5144225ASep 1, 1992
Methods and apparatus for acquiring data from intermittently failing circuits
SCHLUMBERGER TECHNOLOGIES INC46 citations92
US5210487AMay 11, 1993
Double-gated integrating scheme for electron beam tester
SCHLUMBERGER TECHNOLOGIES INC14 citations73
DANA FARBER CANCER INST INC
3 patentsUS5550055AAug 27, 1996
Recombinant DNA-produced T11 and fragments thereof
DANA FARBER CANCER INST INC9 citations69
US5608037AMar 4, 1997
Recombinant DNA-produced T11 and fragments thereof
DANA FARBER CANCER INST INC2 citations58
US5830754ANov 3, 1998
Recombinant DNA-produced T11 and fragments thereof
DANA FARBER CANCER INST INC0 citations48