Inventor
HIRADE MASATO
JP17 patents
Patents
17 patentsUS10598691B2Mar 24, 2020
Scanning probe microscope and light intensity adjusting method
SHIMADZU CORP2 citations71
US10168354B1Jan 1, 2019
Scanning probe microscope
SHIMADZU CORP2 citations71
US9689892B2Jun 27, 2017
Scanning probe microscope
SHIMADZU CORP3 citations71
USD724128SMar 10, 2015
Probe microscope
SHIMADZU CORP5 citations71
US12306208B2May 20, 2025
Information providing system, server device, and analyzer
SHIMADZU CORP0 citations61
US11454647B2Sep 27, 2022
Scanning type probe microscope and control device for scanning type probe microscope
SHIMADZU CORP0 citations61
US11415596B2Aug 16, 2022
Scanning probe microscope and analysis method
SHIMADZU CORP0 citations51
US10846547B2Nov 24, 2020
Data correction method, computer program for causing computer to perform data correction method, image processor, and scanning probe microscope
SHIMADZU CORP0 citations51
US10254307B2Apr 9, 2019
Scanning probe microscope
SHIMADZU CORP0 citations51
US11519936B2Dec 6, 2022
Scanning probe microscope and scanning probe microscope optical axis adjustment method
SHIMADZU CORP0 citations50
US11499989B2Nov 15, 2022
Surface analysis device
SHIMADZU CORP0 citations50
US11162975B1Nov 2, 2021
Surface analyzer
SHIMADZU CORP0 citations50
US11073535B2Jul 27, 2021
Scanning probe microscope with case and elastic body
SHIMADZU CORP0 citations50
US10641790B2May 5, 2020
Scanning probe microscope
SHIMADZU CORP0 citations40
US10088499B2Oct 2, 2018
Scanning probe microscope
SHIMADZU CORP0 citations40
US10564183B2Feb 18, 2020
Scanning probe microscope and surface image correction method
SHIMADZU CORP0 citations39
US10564180B2Feb 18, 2020
Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample
SHIMADZU CORP0 citations39