Inventor

HIGASHI MASASHI

JP2 patents

Patents

2 patents

US6307210B1Oct 23, 2001

Device for imaging object to be inspected and device for inspecting semiconductor package

COGNEX TECH & INVESTMENT CORP55 citations91

US6683682B1Jan 27, 2004

Electronic component inspection equipment

COGNEX TECH & INVESTMENT CORP2 citations58