Inventor
BAZAN GREG
US6 patents
Patents
6 patentsUS7240322B2Jul 3, 2007
Method of adding fabrication monitors to integrated circuit chips
IBM60 citations97
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US6998866B1Feb 14, 2006
Circuit and method for monitoring defects
IBM13 citations83
US7620931B2Nov 17, 2009
Method of adding fabrication monitors to integrated circuit chips
IBM1 citations62
US7323278B2Jan 29, 2008
Method of adding fabrication monitors to integrated circuit chips
IBM3 citations62
US7089514B2Aug 8, 2006
Defect diagnosis for semiconductor integrated circuits
IBM1 citations48