Inventor
GRADY MATTHEW S
US12 patents
⚠️ This page may combine multiple inventors who share the name “GRADY MATTHEW S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
9 patentsUS7240322B2Jul 3, 2007
Method of adding fabrication monitors to integrated circuit chips
IBM60 citations97
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US6789032B2Sep 7, 2004
Method of statistical binning for reliability selection
IBM63 citations91
US6998866B1Feb 14, 2006
Circuit and method for monitoring defects
IBM13 citations83
US7620931B2Nov 17, 2009
Method of adding fabrication monitors to integrated circuit chips
IBM1 citations62
US7323278B2Jan 29, 2008
Method of adding fabrication monitors to integrated circuit chips
IBM3 citations62
US6590382B2Jul 8, 2003
Signal pin tester for AC defects in integrated circuits
IBM2 citations59
US6909274B2Jun 21, 2005
Signal pin tester for AC defects in integrated circuits
IBM0 citations49
US9336109B2May 10, 2016
Real-time rule engine for adaptive testing of integrated circuits
IBM1 citations45