Inventor
VALLETT DAVID P
US26 patents
Patents
26 patentsUS7240322B2Jul 3, 2007
Method of adding fabrication monitors to integrated circuit chips
IBM60 citations97
US7247877B2Jul 24, 2007
Integrated carbon nanotube sensors
IBM24 citations92
US6307162B1Oct 23, 2001
Integrated circuit wiring
IBM22 citations92
US6245587B1Jun 12, 2001
Method for making semiconductor devices having backside probing capability
IBM31 citations92
US5990562ANov 23, 1999
Semiconductor devices having backside probing capability
IBM38 citations92
US7194706B2Mar 20, 2007
Designing scan chains with specific parameter sensitivities to identify process defects
IBM24 citations91
US7116094B2Oct 3, 2006
Apparatus and method for transmission and remote sensing of signals from integrated circuit devices
IBM22 citations91
US7484423B2Feb 3, 2009
Integrated carbon nanotube sensors
IBM12 citations84
US6452209B2Sep 17, 2002
Semiconductor devices having backside probing capability
IBM9 citations74
US6078057AJun 20, 2000
Semiconductor devices having backside probing capability
IBM10 citations74
US7005874B2Feb 28, 2006
Utilizing clock shield as defect monitor
IBM7 citations73
US7202689B2Apr 10, 2007
Sensor differentiated fault isolation
IBM8 citations71
US7620931B2Nov 17, 2009
Method of adding fabrication monitors to integrated circuit chips
IBM1 citations62
US7323278B2Jan 29, 2008
Method of adding fabrication monitors to integrated circuit chips
IBM3 citations62
US7088124B2Aug 8, 2006
Utilizing clock shield as defect monitor
IBM3 citations62
US7089138B1Aug 8, 2006
Canary device for failure analysis
IBM5 citations62
US7511510B2Mar 31, 2009
Nanoscale fault isolation and measurement system
IBM4 citations61
US7397263B2Jul 8, 2008
Sensor differentiated fault isolation
IBM5 citations60
US7285860B2Oct 23, 2007
Method and structure for defect monitoring of semiconductor devices using power bus wiring grids
IBM2 citations60
US7078248B2Jul 18, 2006
Method and structure for defect monitoring of semiconductor devices using power bus wiring grids
IBM3 citations60
US6010392AJan 4, 2000
Die thinning apparatus
IBM6 citations60
US7239167B2Jul 3, 2007
Utilizing clock shield as defect monitor
IBM0 citations52
US7671604B2Mar 2, 2010
Nanoscale fault isolation and measurement system
IBM0 citations51
US7230335B2Jun 12, 2007
Inspection methods and structures for visualizing and/or detecting specific chip structures
IBM1 citations50
US9140669B2Sep 22, 2015
Mapping density and temperature of a chip, in situ
IBM0 citations49
US8987843B2Mar 24, 2015
Mapping density and temperature of a chip, in situ
IBM0 citations49