Inventor
LIU KAI MING
TW22 patents
⚠️ This page may combine multiple inventors who share the name “LIU KAI MING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
8 patentsUS8972916B1Mar 3, 2015
Method and system for checking the inter-chip connectivity of a three-dimensional integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US11387177B2Jul 12, 2022
Package structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations82
US10534892B2Jan 14, 2020
Layout checking system and method
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US9886544B2Feb 6, 2018
Layout checking system and method
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9582630B2Feb 28, 2017
System and method for creating hybrid resistance and capacitance (RC) netlist using three-dimensional RC extraction and 2.5 dimensional RC extraction
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US9495506B2Nov 15, 2016
Methods for layout verification for polysilicon cell edge structures in FinFET standard cells using filters
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations72
US11144704B2Oct 12, 2021
Layout checking system and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US9747409B2Aug 29, 2017
Method of parameter extraction and system thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
TAIWAN SEMICONDUCTOR MFG
5 patentsUS8943455B2Jan 27, 2015
Methods for layout verification for polysilicon cell edge structures in FinFET standard cells
TAIWAN SEMICONDUCTOR MFG38 citations93
US9053288B1Jun 9, 2015
Layout checking system for multiple-patterning group assignment constraints
TAIWAN SEMICONDUCTOR MFG7 citations84
US9342647B2May 17, 2016
Integrated circuit design method and apparatus
TAIWAN SEMICONDUCTOR MFG17 citations83
US9053283B2Jun 9, 2015
Methods for layout verification for polysilicon cell edge structures in finFET standard cells using filters
TAIWAN SEMICONDUCTOR MFG6 citations83
US9331066B2May 3, 2016
Method and computer-readable medium for detecting parasitic transistors by utilizing equivalent circuit and threshold distance
TAIWAN SEMICONDUCTOR MFG0 citations49
DELTA ELECTRONICS INC
4 patentsUS11543742B2Jan 3, 2023
Light source module and projection device
DELTA ELECTRONICS INC0 citations62
US12120470B2Oct 15, 2024
Projection system and calibration method thereof
DELTA ELECTRONICS INC0 citations51
US11879601B2Jan 23, 2024
Light source module
DELTA ELECTRONICS INC0 citations51
US10571791B2Feb 25, 2020
Projection system and optimizing method thereof
DELTA ELECTRONICS INC0 citations38