P

Inventor

FU SSU I

TW117 patents
⚠️ This page may combine multiple inventors who share the name “FU SSU I”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

43 patents
US11062954B2Jul 13, 2021

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP11 citations94
US10607882B2Mar 31, 2020

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP12 citations94
US9735047B1Aug 15, 2017

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP30 citations94
US9349833B1May 24, 2016

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP32 citations94
US9123659B1Sep 1, 2015

Method for manufacturing finFET device

UNITED MICROELECTRONICS CORP30 citations94
US9287263B1Mar 15, 2016

Semiconductor device having a metal gate

UNITED MICROELECTRONICS CORP17 citations93
US9142641B1Sep 22, 2015

Method for manufacturing finFET

UNITED MICROELECTRONICS CORP21 citations93
US9166024B2Oct 20, 2015

FinFET structure with cavities and semiconductor compound portions extending laterally over sidewall spacers

UNITED MICROELECTRONICS CORP23 citations91
US10985264B2Apr 20, 2021

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP9 citations86
US11721591B2Aug 8, 2023

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP3 citations84
US10971397B2Apr 6, 2021

Semiconductor device and method of fabricating the same

UNITED MICROELECTRONICS CORP5 citations84
US10395991B2Aug 27, 2019

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP7 citations84
US10249488B1Apr 2, 2019

Semiconductor devices with same conductive type but different threshold voltages and method of fabricating the same

UNITED MICROELECTRONICS CORP12 citations84
US9905464B2Feb 27, 2018

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP9 citations84
US9793380B2Oct 17, 2017

Semiconductor structure and fabrication method thereof

UNITED MICROELECTRONICS CORP5 citations84
US9786510B2Oct 10, 2017

Fin-shaped structure and manufacturing method thereof

UNITED MICROELECTRONICS CORP5 citations84
US9589966B2Mar 7, 2017

Static random access memory

UNITED MICROELECTRONICS CORP9 citations84
US9455194B1Sep 27, 2016

Method for fabricating semiconductor device

UNITED MICROELECTRONICS CORP7 citations84
US9379119B1Jun 28, 2016

Static random access memory

UNITED MICROELECTRONICS CORP15 citations84
US9054187B2Jun 9, 2015

Semiconductor structure

UNITED MICROELECTRONICS CORP8 citations84
US8993384B2Mar 31, 2015

Semiconductor device and fabrication method thereof

UNITED MICROELECTRONICS CORP7 citations84
US8981487B2Mar 17, 2015

Fin-shaped field-effect transistor (FinFET)

UNITED MICROELECTRONICS CORP7 citations84
US8895396B1Nov 25, 2014

Epitaxial Process of forming stress inducing epitaxial layers in source and drain regions of PMOS and NMOS structures

UNITED MICROELECTRONICS CORP14 citations84
US12068309B2Aug 20, 2024

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP2 citations73
US11901239B2Feb 13, 2024

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP2 citations73
US11710778B2Jul 25, 2023

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP1 citations73
US11495681B2Nov 8, 2022

Semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP2 citations73
US11152515B2Oct 19, 2021

Semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP3 citations73
US10566285B2Feb 18, 2020

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP3 citations73
US10546922B2Jan 28, 2020

Method for fabricating cap layer on an epitaxial layer

UNITED MICROELECTRONICS CORP4 citations73
US10529825B2Jan 7, 2020

Semiconductor device and manufacturing method thereof

UNITED MICROELECTRONICS CORP2 citations73
US10050146B2Aug 14, 2018

Semiconductor device and method of forming the same

UNITED MICROELECTRONICS CORP2 citations73
US10008569B2Jun 26, 2018

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP3 citations73
US9916978B2Mar 13, 2018

Method for fabricating a Fin field effect transistor (FinFET)

UNITED MICROELECTRONICS CORP5 citations73
US9847398B1Dec 19, 2017

Semiconductor device with gate structure having dielectric layer on one side and contact plug on the other side

UNITED MICROELECTRONICS CORP4 citations73
US9773887B2Sep 26, 2017

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP3 citations73
US9685385B1Jun 20, 2017

Method of fabricating semiconductor device

UNITED MICROELECTRONICS CORP4 citations73
US9659873B2May 23, 2017

Semiconductor structure with aligning mark and method of forming the same

UNITED MICROELECTRONICS CORP2 citations73
US9627268B2Apr 18, 2017

Method for fabricating semiconductor device

UNITED MICROELECTRONICS CORP5 citations73
US9508715B1Nov 29, 2016

Semiconductor structure

UNITED MICROELECTRONICS CORP3 citations73
US9384978B1Jul 5, 2016

Method of forming trenches

UNITED MICROELECTRONICS CORP3 citations73
US9224864B1Dec 29, 2015

Semiconductor device and method of fabricating the same

UNITED MICROELECTRONICS CORP4 citations73
US9601600B2Mar 21, 2017

Processes for fabricating FinFET structures with semiconductor compound portions formed in cavities and extending over sidewall spacers

UNITED MICROELECTRONICS CORP3 citations72

TSAI SHIH-HUNG

2 patents

FU SSU-I

2 patents

CHEN YING-TSUNG

2 patents

LIU AN-CHI

1 patent

Showing the top 50 of 117 patents by PatentIndex Score.