Inventor
STROM JOHN T
US15 patents
⚠️ This page may combine multiple inventors who share the name “STROM JOHN T”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
RUDOLPH TECHNOLOGIES INC
8 patentsUS7634128B2Dec 15, 2009
Stereoscopic three-dimensional metrology system and method
RUDOLPH TECHNOLOGIES INC27 citations91
US7960981B2Jun 14, 2011
Apparatus for obtaining planarity measurements with respect to a probe card analysis system
RUDOLPH TECHNOLOGIES INC8 citations83
US7634129B2Dec 15, 2009
Dual-axis scanning system and method
RUDOLPH TECHNOLOGIES INC18 citations83
US7750622B2Jul 6, 2010
Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture
RUDOLPH TECHNOLOGIES INC5 citations73
US7579853B2Aug 25, 2009
Apparatus for obtaining planarity measurements with respect to a probe card analysis system
RUDOLPH TECHNOLOGIES INC6 citations73
US7385409B2Jun 10, 2008
System and method of mitigating effects of component deflection in a probe card analyzer
RUDOLPH TECHNOLOGIES INC7 citations73
US7633306B2Dec 15, 2009
System and method of measuring probe float
RUDOLPH TECHNOLOGIES INC2 citations61
US8358831B2Jan 22, 2013
Probe mark inspection
RUDOLPH TECHNOLOGIES INC3 citations54
APPLIED PRECISION LLC
3 patentsUS7231081B2Jun 12, 2007
Stereoscopic three-dimensional metrology system and method
APPLIED PRECISION LLC36 citations91
US7170307B2Jan 30, 2007
System and method of mitigating effects of component deflection in a probe card analyzer
APPLIED PRECISION LLC18 citations91
US7102368B2Sep 5, 2006
Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
APPLIED PRECISION LLC6 citations73