P

Inventor

QUON ROGER A

US53 patents
⚠️ This page may combine multiple inventors who share the name “QUON ROGER A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

40 patents
US9934970B1Apr 3, 2018

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM22 citations94
US9761655B1Sep 12, 2017

Stacked planar capacitors with scaled EOT

IBM36 citations94
US9991156B2Jun 5, 2018

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

IBM15 citations93
US9786603B1Oct 10, 2017

Surface nitridation in metal interconnects

IBM14 citations93
US9859218B1Jan 2, 2018

Selective surface modification of interconnect structures

IBM16 citations92
US10529569B2Jan 7, 2020

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM5 citations84
US9779944B1Oct 3, 2017

Method and structure for cut material selection

IBM17 citations84
US9607886B1Mar 28, 2017

Self aligned conductive lines with relaxed overlay

IBM6 citations84
US7629264B2Dec 8, 2009

Structure and method for hybrid tungsten copper metal contact

IBM18 citations84
US7144490B2Dec 5, 2006

Method for selective electroplating of semiconductor device I/O pads using a titanium-tungsten seed layer

IBM14 citations84
US9899317B1Feb 20, 2018

Nitridization for semiconductor structures

IBM8 citations82
US7170187B2Jan 30, 2007

Low stress conductive polymer bump

IBM11 citations82
US11133216B2Sep 28, 2021

Interconnect structure

IBM3 citations73
US10957583B2Mar 23, 2021

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

IBM1 citations73
US10699945B2Jun 30, 2020

Back end of line integration for interconnects

IBM5 citations73
US10546774B2Jan 28, 2020

Self-aligned quadruple patterning (SAQP) for routing layouts including multi-track jogs

IBM3 citations73
US10128147B2Nov 13, 2018

Interconnect structure

IBM2 citations73
US10121661B2Nov 6, 2018

Self aligned pattern formation post spacer etchback in tight pitch configurations

IBM2 citations73
US9852946B1Dec 26, 2017

Self aligned conductive lines

IBM2 citations73
US9786554B1Oct 10, 2017

Self aligned conductive lines

IBM5 citations73
US9773700B1Sep 26, 2017

Aligning conductive vias with trenches

IBM5 citations73
US6995475B2Feb 7, 2006

I/C chip suitable for wire bonding

IBM9 citations73
US7442878B2Oct 28, 2008

Low stress conductive polymer bump

IBM7 citations72
US7923836B2Apr 12, 2011

BLM structure for application to copper pad

IBM4 citations63
US7473997B2Jan 6, 2009

Method for forming robust solder interconnect structures by reducing effects of seed layer underetching

IBM4 citations62
US6992389B2Jan 31, 2006

Barrier for interconnect and method

IBM4 citations61
US7926006B2Apr 12, 2011

Variable fill and cheese for mitigation of BEOL topography

IBM4 citations60
US8026166B2Sep 27, 2011

Interconnect structures comprising capping layers with low dielectric constants and methods of making the same

IBM3 citations59
US10615116B2Apr 7, 2020

Surface nitridation in metal interconnects

IBM0 citations52
US10529621B2Jan 7, 2020

Modulating the microstructure of metallic interconnect structures

IBM0 citations52
US10395985B2Aug 27, 2019

Self aligned conductive lines with relaxed overlay

IBM0 citations52
US10373909B2Aug 6, 2019

Selective surface modification of interconnect structures

IBM0 citations52
US10361153B2Jul 23, 2019

Surface nitridation in metal interconnects

IBM0 citations52
US10256185B2Apr 9, 2019

Nitridization for semiconductor structures

IBM0 citations52
US10249532B2Apr 2, 2019

Modulating the microstructure of metallic interconnect structures

IBM0 citations52
US10083864B2Sep 25, 2018

Self aligned conductive lines with relaxed overlay

IBM0 citations52
US10068846B2Sep 4, 2018

Surface nitridation in metal interconnects

IBM0 citations52
US9972533B2May 15, 2018

Aligning conductive vias with trenches

IBM0 citations52
US9953864B2Apr 24, 2018

Interconnect structure

IBM0 citations52
US9911647B2Mar 6, 2018

Self aligned conductive lines

IBM1 citations52

GLOBALFOUNDRIES INC

3 patents

CLEVENGER LAWRENCE A

3 patents

TESSERA LLC

2 patents

TESSERA INC

1 patent

SAMSUNG ELECTRONICS CO LTD

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.