Inventor
BRODIE ALAN D
US26 patents
⚠️ This page may combine multiple inventors who share the name “BRODIE ALAN D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
10 patentsUS10338013B1Jul 2, 2019
Position feedback for multi-beam particle detector
KLA TENCOR CORP10 citations84
US7615747B1Nov 10, 2009
Sampling feedback system
KLA TENCOR CORP8 citations84
US10497536B2Dec 3, 2019
Apparatus and method for correcting arrayed astigmatism in a multi-column scanning electron microscopy system
KLA TENCOR CORP2 citations73
US10242839B2Mar 26, 2019
Reduced Coulomb interactions in a multi-beam column
KLA TENCOR CORP6 citations73
US9214344B1Dec 15, 2015
Pillar-supported array of micro electron lenses
KLA TENCOR CORP4 citations70
US11373838B2Jun 28, 2022
Multi-beam electron characterization tool with telecentric illumination
KLA TENCOR CORP0 citations52
US10072334B2Sep 11, 2018
Digital pattern generator having charge drain coating
KLA TENCOR CORP0 citations50
US11410830B1Aug 9, 2022
Defect inspection and review using transmissive current image of charged particle beam system
KLA TENCOR CORP0 citations47
US9715995B1Jul 25, 2017
Apparatus and methods for electron beam lithography using array cathode
KLA TENCOR CORP0 citations40
US8957394B2Feb 17, 2015
Compact high-voltage electron gun
KLA TENCOR CORP0 citations40
KLA INSTR CORP
4 patentsUS5717204AFeb 10, 1998
Inspecting optical masks with electron beam microscopy
KLA INSTR CORP148 citations98
US5665968ASep 9, 1997
Inspecting optical masks with electron beam microscopy
KLA INSTR CORP120 citations97
US5578821ANov 26, 1996
Electron beam inspection system and method
KLA INSTR CORP421 citations95
US5502306AMar 26, 1996
Electron beam inspection system and method
KLA INSTR CORP400 citations95
MULTIBEAM SYSTEMS INC
3 patentsUS6844550B1Jan 18, 2005
Multi-beam multi-column electron beam inspection system
MULTIBEAM SYSTEMS INC142 citations97
US6617587B2Sep 9, 2003
Electron optics for multi-beam electron beam lithography tool
MULTIBEAM SYSTEMS INC104 citations95
US6977375B2Dec 20, 2005
Multi-beam multi-column electron beam inspection system
MULTIBEAM SYSTEMS INC47 citations94