Inventor · disambiguated record

Juan Ignacio Alonso Montull

Also filed as: MONTULL JUAN IGNACIO ALONSO

1 granted patent·15 citations·filing 2000–2000

37Inventor score

Technology areasG01R

Files withAGERE SYST GUARDIAN CORP1

Top patents by PatentIndex Score

1 record

0161US6445206B1Method and apparatus for determining yield impacting tests at wafer level package level for semiconductor devicesAGERE SYST GUARDIAN CORP·Filed 2000·Granted Sep 3, 2002·15 cites·22 claims

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