Inventor
MORITA NOBORU
JP27 patents
⚠️ This page may combine multiple inventors who share the name “MORITA NOBORU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC ELECTRONICS CORP
15 patentsUS7391115B2Jun 24, 2008
Semiconductor device and manufacturing method thereof
NEC ELECTRONICS CORP23 citations92
US7132732B2Nov 7, 2006
Semiconductor device having two distinct sioch layers
NEC ELECTRONICS CORP16 citations92
US7763979B2Jul 27, 2010
Organic insulating film, manufacturing method thereof, semiconductor device using such organic insulating film and manufacturing method thereof
NEC ELECTRONICS CORP12 citations84
US7615498B2Nov 10, 2009
Method of manufacturing a semiconductor device
NEC ELECTRONICS CORP10 citations84
US7180191B2Feb 20, 2007
Semiconductor device and method of manufacturing a semiconductor device
NEC ELECTRONICS CORP14 citations84
US7563705B2Jul 21, 2009
Manufacturing method of semiconductor device
NEC ELECTRONICS CORP10 citations83
US7420279B2Sep 2, 2008
Carbon containing silicon oxide film having high ashing tolerance and adhesion
NEC ELECTRONICS CORP13 citations81
US7473630B2Jan 6, 2009
Semiconductor device and method for manufacturing same
NEC ELECTRONICS CORP7 citations74
US7102236B2Sep 5, 2006
Carbon containing silicon oxide film having high ashing tolerance and adhesion
NEC ELECTRONICS CORP6 citations70
US7135776B2Nov 14, 2006
Semiconductor device and method for manufacturing same
NEC ELECTRONICS CORP2 citations63
US7833901B2Nov 16, 2010
Method for manufacturing a semiconductor device having a multi-layered insulating structure of SiOCH layers and an SiO2 layer
NEC ELECTRONICS CORP5 citations62
US7074698B2Jul 11, 2006
Method of fabricating semiconductor device using plasma-enhanced CVD
NEC ELECTRONICS CORP5 citations62
US7482263B2Jan 27, 2009
Semiconductor device and method for manufacturing the same
NEC ELECTRONICS CORP0 citations52
US7045895B2May 16, 2006
Semiconductor device and method for manufacturing the same
NEC ELECTRONICS CORP1 citations52
US7582970B2Sep 1, 2009
Carbon containing silicon oxide film having high ashing tolerance and adhesion
NEC ELECTRONICS CORP0 citations47
FUJITSU LTD
4 patentsUS7634524B2Dec 15, 2009
Arithmetic method and function arithmetic circuit for a fast fourier transform
FUJITSU LTD19 citations82
US7461114B2Dec 2, 2008
Fourier transform apparatus
FUJITSU LTD12 citations82
US6938191B2Aug 30, 2005
Access control device and testing method
FUJITSU LTD6 citations61
US7620676B2Nov 17, 2009
Lookup table and data acquisition method
FUJITSU LTD2 citations60