Inventor
SANADA MASARU
JP16 patents
⚠️ This page may combine multiple inventors who share the name “SANADA MASARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEC CORP
9 patentsUS6173426B1Jan 9, 2001
Method of locating faults in LSI
NEC CORP17 citations83
US5943346AAug 24, 1999
Fault point estimating system using abnormal current and potential contrast images
NEC CORP17 citations83
US5850404ADec 15, 1998
Fault block detecting system using abnormal current
NEC CORP19 citations83
US6285040B1Sep 4, 2001
Internal-logic inspection circuit
NEC CORP7 citations73
US6136618AOct 24, 2000
Semiconductor device manufacturing process diagnosis system suitable for diagnoses of manufacturing process of logic LSI composed of a plurality of logic circuit blocks and diagnosis method thereof
NEC CORP8 citations73
US5640099AJun 17, 1997
Method and apparatus for detecting short circuit point between wiring patterns
NEC CORP10 citations73
US5329139AJul 12, 1994
Semiconductor integrated circuit device analyzable by using laser beam inducing current
NEC CORP9 citations73
US6144084ANov 7, 2000
Semiconductor integrated circuit having a logic verifying structure and method of manufacturing the same
NEC CORP4 citations62
US5864566AJan 26, 1999
Fault block detecting system using abnormal current and abnormal data output
NEC CORP5 citations62
MAEKAWA SEISAKUSHO KK
2 patentsUS6041617AMar 28, 2000
Adsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in same
MAEKAWA SEISAKUSHO KK40 citations90
US5732569AMar 31, 1998
Adsorption type cooling apparatus, method of controlling cold output of same, and fin type adsorbent heat exchanger for use in the same
MAEKAWA SEISAKUSHO KK43 citations90