Inventor

FANG WALX

TW2 patents

Patents

2 patents

US6820029B2Nov 16, 2004

Method for determining failure rate and selecting best burn-in time

UNITED MICROELECTRONICS CORP6 citations58

US6388460B1May 14, 2002

Alternate timing wafer burn-in method

UNITED MICROELECTRONICS CORP4 citations58