Inventor
VAN DER STRATEN OSCAR
US152 patents
⚠️ This page may combine multiple inventors who share the name “VAN DER STRATEN OSCAR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
48 patentsUS7528066B2May 5, 2009
Structure and method for metal integration
IBM50 citations96
US10580966B1Mar 3, 2020
Faceted sidewall magnetic tunnel junction structure
IBM20 citations94
US9741812B1Aug 22, 2017
Dual metal interconnect structure
IBM28 citations94
US9934977B1Apr 3, 2018
Salicide bottom contacts
IBM14 citations93
US9437714B1Sep 6, 2016
Selective gate contact fill metallization
IBM23 citations93
US10461148B1Oct 29, 2019
Multilayer buried metal-insultor-metal capacitor structures
IBM10 citations84
US10411109B2Sep 10, 2019
Bipolar junction transistor (BJT) for liquid flow biosensing applications without a reference electrode and large sensing area
IBM6 citations84
US10269698B1Apr 23, 2019
Binary metallization structure for nanoscale dual damascene interconnects
IBM7 citations84
US10170419B2Jan 1, 2019
Biconvex low resistance metal wire
IBM6 citations84
US10090287B1Oct 2, 2018
Deep high capacity capacitor for bulk substrates
IBM8 citations84
US10056329B1Aug 21, 2018
Programmable buried antifuse
IBM5 citations84
US10049980B1Aug 14, 2018
Low resistance seed enhancement spacers for voidless interconnect structures
IBM7 citations84
US9935051B2Apr 3, 2018
Multi-level metallization interconnect structure
IBM12 citations84
US9735165B1Aug 15, 2017
Vertically stacked FinFET fuse
IBM9 citations84
US9722038B2Aug 1, 2017
Metal cap protection layer for gate and contact metallization
IBM7 citations84
US9613899B1Apr 4, 2017
Epitaxial semiconductor fuse for FinFET structure
IBM7 citations84
US7800228B2Sep 21, 2010
Reliable via contact interconnect structure
IBM12 citations84
US10074727B2Sep 11, 2018
Low resistivity wrap-around contacts
IBM15 citations83
US11758819B2Sep 12, 2023
Magneto-resistive random access memory with laterally-recessed free layer
IBM2 citations73
US11239414B2Feb 1, 2022
Physical unclonable function for MRAM structures
IBM2 citations73
US11183455B2Nov 23, 2021
Interconnects with enlarged contact area
IBM2 citations73
US11069854B2Jul 20, 2021
Laser anneal for MRAM encapsulation enhancement
IBM2 citations73
US10950493B1Mar 16, 2021
Interconnects having air gap spacers
IBM2 citations73
US10672611B2Jun 2, 2020
Hardmask stress, grain, and structure engineering for advanced memory applications
IBM3 citations73
US10546915B2Jan 28, 2020
Buried MIM capacitor structure with landing pads
IBM2 citations73
US10541202B2Jan 21, 2020
Programmable buried antifuse
IBM2 citations73
US10446746B1Oct 15, 2019
ReRAM structure formed by a single process
IBM3 citations73
US10388600B2Aug 20, 2019
Binary metallization structure for nanoscale dual damascene interconnects
IBM5 citations73
US10340355B2Jul 2, 2019
Method of forming a dual metal interconnect structure
IBM3 citations73
US10312097B2Jun 4, 2019
Salicide bottom contacts
IBM2 citations73
US10249501B2Apr 2, 2019
Single process for liner and metal fill
IBM2 citations73
US10211095B2Feb 19, 2019
High performance middle of line interconnects
IBM2 citations73
US10170360B2Jan 1, 2019
Reflow enhancement layer for metallization structures
IBM2 citations73
US10128188B2Nov 13, 2018
High aspect ratio contact metallization without seams
IBM2 citations73
US10109740B2Oct 23, 2018
Programmable bulk FinFET antifuses
IBM4 citations73
US10056391B2Aug 21, 2018
Vertically stacked FinFET fuse
IBM4 citations73
US10038050B2Jul 31, 2018
FinFET resistor and method to fabricate same
IBM3 citations73
US10008507B2Jun 26, 2018
Metal FinFET anti-fuse
IBM2 citations73
US10002789B2Jun 19, 2018
High performance middle of line interconnects
IBM2 citations73
US9947621B2Apr 17, 2018
Structure and method to reduce copper loss during metal cap formation
IBM4 citations73
US9922941B1Mar 20, 2018
Thin low defect relaxed silicon germanium layers on bulk silicon substrates
IBM3 citations73
US9876075B2Jan 23, 2018
Method of forming dielectric with air gaps for use in semiconductor devices
IBM3 citations73
US9859219B1Jan 2, 2018
Copper wiring structures with copper titanium encapsulation
IBM2 citations73
US9842770B1Dec 12, 2017
Reflow enhancement layer for metallization structures
IBM2 citations73
US9812522B2Nov 7, 2017
Metal-insulator-metal capacitor fabrication with unitary sputtering process
IBM4 citations73
US9793213B2Oct 17, 2017
Ion flow barrier structure for interconnect metallization
IBM2 citations73
US9564310B1Feb 7, 2017
Metal-insulator-metal capacitor fabrication with unitary sputtering process
IBM4 citations73
US10361277B2Jul 23, 2019
Low resistivity wrap-around contacts
IBM2 citations72
YANG CHIH-CHAO
1 patentGLOBALFOUNDRIES INC
1 patentShowing the top 50 of 152 patents by PatentIndex Score.