Inventor
ADUSUMILLI PRANEET
US153 patents
⚠️ This page may combine multiple inventors who share the name “ADUSUMILLI PRANEET”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
49 patentsUS9496225B1Nov 15, 2016
Recessed metal liner contact with copper fill
IBM409 citations99
US10580966B1Mar 3, 2020
Faceted sidewall magnetic tunnel junction structure
IBM20 citations94
US9805989B1Oct 31, 2017
Sacrificial cap for forming semiconductor contact
IBM29 citations94
US9768077B1Sep 19, 2017
Low resistance dual liner contacts for Fin Field-Effect Transistors (FinFETs)
IBM21 citations94
US9741812B1Aug 22, 2017
Dual metal interconnect structure
IBM28 citations94
US9934977B1Apr 3, 2018
Salicide bottom contacts
IBM14 citations93
US9437714B1Sep 6, 2016
Selective gate contact fill metallization
IBM23 citations93
US10461148B1Oct 29, 2019
Multilayer buried metal-insultor-metal capacitor structures
IBM10 citations84
US10269698B1Apr 23, 2019
Binary metallization structure for nanoscale dual damascene interconnects
IBM7 citations84
US10170419B2Jan 1, 2019
Biconvex low resistance metal wire
IBM6 citations84
US10090287B1Oct 2, 2018
Deep high capacity capacitor for bulk substrates
IBM8 citations84
US10056329B1Aug 21, 2018
Programmable buried antifuse
IBM5 citations84
US10049980B1Aug 14, 2018
Low resistance seed enhancement spacers for voidless interconnect structures
IBM7 citations84
US9978750B1May 22, 2018
Low resistance source/drain contacts for complementary metal oxide semiconductor (CMOS) devices
IBM11 citations84
US9935051B2Apr 3, 2018
Multi-level metallization interconnect structure
IBM12 citations84
US9805973B2Oct 31, 2017
Dual silicide liner flow for enabling low contact resistance
IBM6 citations84
US9735165B1Aug 15, 2017
Vertically stacked FinFET fuse
IBM9 citations84
US9722038B2Aug 1, 2017
Metal cap protection layer for gate and contact metallization
IBM7 citations84
US9613899B1Apr 4, 2017
Epitaxial semiconductor fuse for FinFET structure
IBM7 citations84
US9570574B1Feb 14, 2017
Recessed metal liner contact with copper fill
IBM6 citations84
US10074727B2Sep 11, 2018
Low resistivity wrap-around contacts
IBM15 citations83
US12057387B2Aug 6, 2024
Decoupling capacitor inside gate cut trench
IBM2 citations73
US11588105B2Feb 21, 2023
Phase-change memory device with reduced programming voltage
IBM2 citations73
US11133217B1Sep 28, 2021
Late gate cut with optimized contact trench size
IBM2 citations73
US11062956B2Jul 13, 2021
Low resistance source-drain contacts using high temperature silicides
IBM1 citations73
US10943988B2Mar 9, 2021
Thermally stable salicide formation for salicide first contacts
IBM1 citations73
US10937889B2Mar 2, 2021
Forming thermally stable salicide for salicide first contacts
IBM1 citations73
US10915811B1Feb 9, 2021
Intercalation cells for multi-task learning
IBM4 citations73
US10885979B2Jan 5, 2021
Paired intercalation cells for drift migration
IBM2 citations73
US10825740B2Nov 3, 2020
Low resistance source-drain contacts using high temperature silicides
IBM1 citations73
US10685888B2Jun 16, 2020
Low resistance source-drain contacts using high temperature silicides
IBM3 citations73
US10546941B2Jan 28, 2020
Forming thermally stable salicide for salicide first contacts
IBM3 citations73
US10546915B2Jan 28, 2020
Buried MIM capacitor structure with landing pads
IBM2 citations73
US10541202B2Jan 21, 2020
Programmable buried antifuse
IBM2 citations73
US10453935B2Oct 22, 2019
Thermally stable salicide formation for salicide first contacts
IBM1 citations73
US10446746B1Oct 15, 2019
ReRAM structure formed by a single process
IBM3 citations73
US10431503B2Oct 1, 2019
Sacrificial cap for forming semiconductor contact
IBM4 citations73
US10388600B2Aug 20, 2019
Binary metallization structure for nanoscale dual damascene interconnects
IBM5 citations73
US10340355B2Jul 2, 2019
Method of forming a dual metal interconnect structure
IBM3 citations73
US10312097B2Jun 4, 2019
Salicide bottom contacts
IBM2 citations73
US10249501B2Apr 2, 2019
Single process for liner and metal fill
IBM2 citations73
US10211095B2Feb 19, 2019
High performance middle of line interconnects
IBM2 citations73
US10211207B2Feb 19, 2019
Low resistance source/drain contacts for complementary metal oxide semiconductor (CMOS) devices
IBM1 citations73
US10170360B2Jan 1, 2019
Reflow enhancement layer for metallization structures
IBM2 citations73
US10128188B2Nov 13, 2018
High aspect ratio contact metallization without seams
IBM2 citations73
US10109740B2Oct 23, 2018
Programmable bulk FinFET antifuses
IBM4 citations73
US10056391B2Aug 21, 2018
Vertically stacked FinFET fuse
IBM4 citations73
US10038050B2Jul 31, 2018
FinFET resistor and method to fabricate same
IBM3 citations73
US10008507B2Jun 26, 2018
Metal FinFET anti-fuse
IBM2 citations73
GLOBALFOUNDRIES INC
1 patentShowing the top 50 of 153 patents by PatentIndex Score.