Inventor
BIRMIWAL PARAG
US9 patents
⚠️ This page may combine multiple inventors who share the name “BIRMIWAL PARAG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
7 patentsUS7386775B2Jun 10, 2008
Scan verification for a scan-chain device under test
IBM27 citations89
US7408336B2Aug 5, 2008
Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component
IBM16 citations82
US7512925B2Mar 31, 2009
System and method for reducing test time for loading and executing an architecture verification program for a SoC
IBM11 citations77
US7853420B2Dec 14, 2010
Performing temporal checking
IBM3 citations62
US7464354B2Dec 9, 2008
Method and apparatus for performing temporal checking
IBM5 citations62
US7915884B2Mar 29, 2011
Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component
IBM3 citations61
US7934042B2Apr 26, 2011
Voltage indicator signal generation system and method
IBM0 citations51