Inventor
YAMASHITA KYOJI
JP43 patents
⚠️ This page may combine multiple inventors who share the name “YAMASHITA KYOJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
16 patentsUS7279727B2Oct 9, 2007
Semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD124 citations97
US5841173ANov 24, 1998
MOS semiconductor device with excellent drain current
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD69 citations96
US7230435B2Jun 12, 2007
Capacitance measurement circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD25 citations92
US7126174B2Oct 24, 2006
Semiconductor device and method of manufacturing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations92
US6281562B1Aug 28, 2001
Semiconductor device which reduces the minimum distance requirements between active areas
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD28 citations92
US5610430AMar 11, 1997
Semiconductor device having reduced gate overlapping capacitance
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD31 citations92
US5879983AMar 9, 1999
Semiconductor device and method for manufacturing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD16 citations82
US6594598B1Jul 15, 2003
Method for controlling production line
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10 citations74
US6492672B1Dec 10, 2002
Semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations74
US6124160ASep 26, 2000
Semiconductor device and method for manufacturing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations74
US5856754AJan 5, 1999
Semiconductor integrated circuit with parallel/serial/parallel conversion
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD9 citations74
US5675168AOct 7, 1997
Unsymmetrical MOS device having a gate insulator area offset from the source and drain areas, and ESD protection circuit including such a MOS device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD16 citations74
US6982555B2Jan 3, 2006
Semiconductor device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD8 citations73
US6967409B2Nov 22, 2005
Semiconductor device and method of manufacturing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD3 citations63
US6709950B2Mar 23, 2004
Semiconductor device and method of manufacturing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations63
US7171640B2Jan 30, 2007
System and method for operation verification of semiconductor integrated circuit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1 citations51
TOSHIBA KK
14 patentsUS6084716AJul 4, 2000
Optical substrate inspection apparatus
TOSHIBA KK89 citations96
US5185812AFeb 9, 1993
Optical pattern inspection system
TOSHIBA KK92 citations94
US6883160B2Apr 19, 2005
Pattern inspection apparatus
TOSHIBA KK23 citations93
US6396943B2May 28, 2002
Defect inspection method and defect inspection apparatus
TOSHIBA KK48 citations92
US5404410AApr 4, 1995
Method and system for generating a bit pattern
TOSHIBA KK38 citations92
US7421109B2Sep 2, 2008
Pattern inspection apparatus
TOSHIBA KK13 citations84
US7209584B2Apr 24, 2007
Pattern inspection apparatus
TOSHIBA KK11 citations84
US7032208B2Apr 18, 2006
Defect inspection apparatus
TOSHIBA KK12 citations84
US5100234AMar 31, 1992
Method and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objects
TOSHIBA KK18 citations82
US7551767B2Jun 23, 2009
Pattern inspection apparatus
TOSHIBA KK5 citations74
US4988197AJan 29, 1991
Method and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objects
TOSHIBA KK8 citations73
US7415149B2Aug 19, 2008
Pattern inspection apparatus
TOSHIBA KK3 citations63
US5844809ADec 1, 1998
Method and apparatus for generating two-dimensional circuit pattern
TOSHIBA KK5 citations63
US7519593B2Apr 14, 2009
Data searching system, method of synchronizing metadata and data searching apparatus
TOSHIBA KK5 citations57
PANASONIC CORP
5 patentsUS7476957B2Jan 13, 2009
Semiconductor integrated circuit
PANASONIC CORP9 citations83
US7792663B2Sep 7, 2010
Circuit simulation method
PANASONIC CORP9 citations82
US7562327B2Jul 14, 2009
Mask layout design improvement in gate width direction
PANASONIC CORP17 citations82
US8013361B2Sep 6, 2011
Semiconductor device and method for fabricating the same
PANASONIC CORP6 citations58
US7709900B2May 4, 2010
Semiconductor device
PANASONIC CORP1 citations51
ADVANCED MASK INSPECTION TECH
3 patentsUS7655904B2Feb 2, 2010
Target workpiece inspection apparatus, image alignment method, and computer-readable recording medium with program recorded thereon
ADVANCED MASK INSPECTION TECH9 citations84
US7809181B2Oct 5, 2010
Pattern inspection apparatus, image alignment method, displacement amount estimation method, and computer-readable recording medium with program recorded thereon
ADVANCED MASK INSPECTION TECH7 citations74
US7577288B2Aug 18, 2009
Sample inspection apparatus, image alignment method, and program-recorded readable recording medium
ADVANCED MASK INSPECTION TECH6 citations63
RENESAS TECH CORP
2 patentsYAMASHITA KYOJI
2 patentsUS8260031B2Sep 4, 2012
Pattern inspection apparatus, pattern inspection method, and computer-readable recording medium storing a program
YAMASHITA KYOJI6 citations71
US8233698B2Jul 31, 2012
Pattern inspection apparatus, corrected image generation method, and computer-readable recording medium storing program
YAMASHITA KYOJI4 citations60