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Inventor
RUMIANTSEV ANDREJ
DE
6 patents
⚠️ This page may combine multiple inventors who share the name “RUMIANTSEV ANDREJ”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CASCADE MICROTECH INC
2 patents
US7999563B2
Aug 16, 2011
Chuck for supporting and retaining a test substrate and a calibration substrate
CASCADE MICROTECH INC
5 citations
68
US8344744B2
Jan 1, 2013
Probe station for on-wafer-measurement under EMI-shielding
CASCADE MICROTECH INC
3 citations
61
SUSS MICROTEC TEST SYS GMBH
2 patents
US7769555B2
Aug 3, 2010
Method for calibration of a vectorial network analyzer
SUSS MICROTEC TEST SYS GMBH
2 citations
60
US7768271B2
Aug 3, 2010
Method for calibration of a vectorial network analyzer having more than two ports
SUSS MICROTEC TEST SYS GMBH
2 citations
60
MPI CORP
1 patent
US10048844B2
Aug 14, 2018
Operating method for inspecting equipment
MPI CORP
0 citations
45
RUMIANTSEV ANDREJ
1 patent
US8680879B2
Mar 25, 2014
Chuck for supporting and retaining a test substrate and a calibration substrate
RUMIANTSEV ANDREJ
0 citations
44