P

Inventor

NYE III HENRY A

US20 patents

Patents

20 patents
US5503286AApr 2, 1996

Electroplated solder terminal

IBM131 citations99
US5629564AMay 13, 1997

Electroplated solder terminal

IBM111 citations98
US5268072ADec 7, 1993

Etching processes for avoiding edge stress in semiconductor chip solder bumps

IBM119 citations96
US6261945B1Jul 17, 2001

Crackstop and oxygen barrier for low-K dielectric integrated circuits

IBM73 citations94
US7517736B2Apr 14, 2009

Structure and method of chemically formed anchored metallic vias

IBM34 citations93
US6133136AOct 17, 2000

Robust interconnect structure

IBM77 citations93
US7410833B2Aug 12, 2008

Interconnections for flip-chip using lead-free solders and having reaction barrier layers

IBM14 citations92
US6821890B2Nov 23, 2004

Method for improving adhesion to copper

IBM37 citations92
US6271595B1Aug 7, 2001

Method for improving adhesion to copper

IBM30 citations92
US6531759B2Mar 11, 2003

Alpha particle shield for integrated circuit

IBM19 citations91
US6486557B1Nov 26, 2002

Hybrid dielectric structure for improving the stiffness of back end of the line structures

IBM48 citations91
US6908841B2Jun 21, 2005

Support structures for wirebond regions of contact pads over low modulus materials

IBM56 citations90
US7273803B2Sep 25, 2007

Ball limiting metallurgy, interconnection structure including the same, and method of forming an interconnection structure

IBM16 citations82
US6784516B1Aug 31, 2004

Insulative cap for laser fusing

IBM5 citations74
US6946379B2Sep 20, 2005

Insulative cap for laser fusing

IBM2 citations63
US8026613B2Sep 27, 2011

Interconnections for flip-chip using lead-free solders and having reaction barrier layers

IBM4 citations62
US7923849B2Apr 12, 2011

Interconnections for flip-chip using lead-free solders and having reaction barrier layers

IBM3 citations62
US7037559B2May 2, 2006

Immersion plating and plated structures

IBM3 citations60
US7276296B2Oct 2, 2007

Immersion plating and plated structures

IBM1 citations49
US6900142B2May 31, 2005

Inhibition of tin oxide formation in lead free interconnect formation

IBM1 citations46