Inventor
KIM DAE-SUK
KR47 patents
⚠️ This page may combine multiple inventors who share the name “KIM DAE-SUK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SK HYNIX INC
29 patentsUS9818469B1Nov 14, 2017
Refresh control device and semiconductor device including the same
SK HYNIX INC90 citations98
US12095478B2Sep 17, 2024
Memory and operation method of memory
SK HYNIX INC3 citations73
US11514998B2Nov 29, 2022
Electronic device for performing data masking operation
SK HYNIX INC2 citations73
US9928896B1Mar 27, 2018
Refresh control device
SK HYNIX INC3 citations73
US9916885B2Mar 13, 2018
Semiconductor devices having a refresh operation
SK HYNIX INC2 citations73
US9589670B2Mar 7, 2017
Input circuit of three-dimensional semiconductor apparatus capable of enabling testing and direct access
SK HYNIX INC2 citations73
US9312868B2Apr 12, 2016
Clock phase adjusting circuit and semiconductor device including the same
SK HYNIX INC2 citations63
US11074957B2Jul 27, 2021
Semiconductor device
SK HYNIX INC0 citations62
US12362033B2Jul 15, 2025
Semiconductor module for performing error correction operation
SK HYNIX INC0 citations61
US12100466B2Sep 24, 2024
Memory device including error correction device
SK HYNIX INC0 citations61
US12099411B2Sep 24, 2024
Error processing circuit, memory and operation method of the memory
SK HYNIX INC0 citations61
US11217286B2Jan 4, 2022
Semiconductor memory device with power down operation
SK HYNIX INC0 citations61
US11133042B2Sep 28, 2021
Semiconductor memory system and semiconductor memory device, which can be remotely initialized
SK HYNIX INC0 citations61
US10998033B2May 4, 2021
Semiconductor memory device and operating method thereof
SK HYNIX INC1 citations61
US10311923B2Jun 4, 2019
Input circuit of three-dimensional semiconductor apparatus capable of enabling testing and direct access
SK HYNIX INC0 citations52
US10198201B2Feb 5, 2019
Semiconductor apparatus, memory system and repair method thereof
SK HYNIX INC0 citations52
US9584106B2Feb 28, 2017
Semiconductor integrated circuit apparatus
SK HYNIX INC0 citations52
US9570120B2Feb 14, 2017
Memory device and operation method thereof
SK HYNIX INC1 citations52
US9263112B2Feb 16, 2016
Semiconductor integrated circuit
SK HYNIX INC0 citations52
US9001547B2Apr 7, 2015
Semiconductor apparatus, test method using the same and muti chips system
SK HYNIX INC0 citations52
US10777241B2Sep 15, 2020
Semiconductor devices and semiconductor systems
SK HYNIX INC0 citations51
US10147471B2Dec 4, 2018
Semiconductor devices and semiconductor systems
SK HYNIX INC0 citations51
US10037788B2Jul 31, 2018
Semiconductor devices and semiconductor systems
SK HYNIX INC0 citations51
US9793896B1Oct 17, 2017
Semiconductor device
SK HYNIX INC0 citations51
US12288594B2Apr 29, 2025
Memory and operation method of memory
SK HYNIX INC0 citations50
US12253912B2Mar 18, 2025
Memory including error correction circuit and operating method thereof
SK HYNIX INC0 citations50
US11874734B2Jan 16, 2024
Memory and operation method of the same
SK HYNIX INC0 citations50
US12417815B2Sep 16, 2025
Memory device including error correction device
SK HYNIX INC0 citations49
US9606174B2Mar 28, 2017
Semiconductor device that supporting a built-in self-test (BIST) operation and multi-semiconductor package including the same
SK HYNIX INC0 citations42
SAMSUNG DISPLAY CO LTD
6 patentsUS11508936B2Nov 22, 2022
Display device including block patterns
SAMSUNG DISPLAY CO LTD2 citations72
US11616116B2Mar 28, 2023
Display device including dummy lines overlapping connection lines
SAMSUNG DISPLAY CO LTD1 citations62
US12414440B2Sep 9, 2025
Display device
SAMSUNG DISPLAY CO LTD0 citations52
US11502151B2Nov 15, 2022
Display device
SAMSUNG DISPLAY CO LTD0 citations51
US12550549B2Feb 10, 2026
Display panel
SAMSUNG DISPLAY CO LTD0 citations49
US9685464B2Jun 20, 2017
Display substrate and method of manufacturing mother substrate for display substrate
SAMSUNG DISPLAY CO LTD0 citations39
KIM DAE-SUK
5 patentsUS8946869B2Feb 3, 2015
Integrated circuit for detecting defects of through chip via
KIM DAE-SUK1 citations51
US8782476B2Jul 15, 2014
Memory and test method for memory
KIM DAE-SUK0 citations51
US8427883B2Apr 23, 2013
Setting circuit and integrated circuit including the same
KIM DAE-SUK0 citations51
US8107310B2Jan 31, 2012
Semiconductor memory device and method for operating the same
KIM DAE-SUK0 citations51
US8797814B2Aug 5, 2014
Multi-test apparatus and method for testing a plurailty of semiconductor chips
KIM DAE-SUK0 citations41