Inventor
NOH EUNSUN
KR20 patents
⚠️ This page may combine multiple inventors who share the name “NOH EUNSUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
16 patentsUS11237224B2Feb 1, 2022
Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US10892196B2Jan 12, 2021
Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the same
SAMSUNG ELECTRONICS CO LTD4 citations72
US10347819B2Jul 9, 2019
Magnetic memory devices having conductive pillar structures including patterning residue components
SAMSUNG ELECTRONICS CO LTD2 citations72
US11037611B2Jun 15, 2021
Magnetic property measuring systems, methods for measuring magnetic properties, and methods for manufacturing magnetic memory devices using the same
SAMSUNG ELECTRONICS CO LTD2 citations70
US12477956B2Nov 18, 2025
Magnetic memory device including capping pattern on non-magnetic pattern
SAMSUNG ELECTRONICS CO LTD1 citations63
US11834738B2Dec 5, 2023
Sputtering apparatus and method of fabricating magnetic memory device using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11727973B2Aug 15, 2023
Magnetic property measuring systems, methods for measuring magnetic properties, and methods for manufacturing magnetic memory devices using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11535930B2Dec 27, 2022
Sputtering apparatus and method of fabricating magnetic memory device using the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US11205679B2Dec 21, 2021
Magnetic memory device including a free layer and a pinned layer
SAMSUNG ELECTRONICS CO LTD0 citations62
US10957845B2Mar 23, 2021
Magnetic memory devices and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations62
US10553790B1Feb 4, 2020
Method of manufacuring a magnetic memory device
SAMSUNG ELECTRONICS CO LTD1 citations62
US11600537B2Mar 7, 2023
Magnetic property measuring system, a method for measuring magnetic properties, and a method for manufacturing a magnetic memory device using the same
SAMSUNG ELECTRONICS CO LTD0 citations61
US12575331B2Mar 10, 2026
Magnetic tunnel junction and magnetic memory device with amorphous metal boride and diffusion barrier
SAMSUNG ELECTRONICS CO LTD0 citations57
US10862025B2Dec 8, 2020
Magnetic memory devices
SAMSUNG ELECTRONICS CO LTD0 citations52
US10622546B2Apr 14, 2020
Magnetic memory device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations50
US11227665B2Jan 18, 2022
Magnetic memory device
SAMSUNG ELECTRONICS CO LTD0 citations47