Inventor
NA MYUNG-HEE
US26 patents
⚠️ This page may combine multiple inventors who share the name “NA MYUNG-HEE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
22 patentsUS9735029B1Aug 15, 2017
Metal fill optimization for self-aligned double patterning
IBM22 citations93
US8928086B2Jan 6, 2015
Strained finFET with an electrically isolated channel
IBM19 citations93
US8354309B2Jan 15, 2013
Method of providing threshold voltage adjustment through gate dielectric stack modification
IBM24 citations92
US7011980B1Mar 14, 2006
Method and structures for measuring gate tunneling leakage parameters of field effect transistors
IBM34 citations92
US10892331B2Jan 12, 2021
Channel orientation of CMOS gate-all-around field-effect transistor devices for enhanced carrier mobility
IBM9 citations86
US9190520B2Nov 17, 2015
Strained finFET with an electrically isolated channel
IBM15 citations84
US9171935B2Oct 27, 2015
FinFET formation with late fin reveal
IBM9 citations83
US10833267B2Nov 10, 2020
Structure and method to form phase change memory cell with self- align top electrode contact
IBM3 citations73
US9029913B2May 12, 2015
Silicon-germanium fins and silicon fins on a bulk substrate
IBM5 citations73
US10614877B1Apr 7, 2020
4T static random access memory bitcell retention
IBM3 citations71
US10381068B2Aug 13, 2019
Ultra dense and stable 4T SRAM cell design having NFETs and PFETs
IBM4 citations71
US11101367B2Aug 24, 2021
Contact-first field-effect transistors
IBM0 citations62
US10937961B2Mar 2, 2021
Structure and method to form bi-layer composite phase-change-memory cell
IBM1 citations62
US10424574B2Sep 24, 2019
Standard cell architecture with at least one gate contact over an active area
IBM1 citations62
US10693005B2Jun 23, 2020
Reliable gate contacts over active areas
IBM1 citations60
US10803933B2Oct 13, 2020
Self-aligned high density and size adjustable phase change memory
IBM0 citations52
US10424576B2Sep 24, 2019
Standard cell architecture with at least one gate contact over an active area
IBM0 citations52
US8648647B2Feb 11, 2014
Determining current of a first FET of body connected FETs
IBM0 citations52
US7795098B1Sep 14, 2010
Rotated field effect transistors and method of manufacture
IBM0 citations52
US7335563B2Feb 26, 2008
Rotated field effect transistors and method of manufacture
IBM0 citations52
US10381338B2Aug 13, 2019
Metal fill optimization for self-aligned double patterning
IBM0 citations51
US8032349B2Oct 4, 2011
Efficient methodology for the accurate generation of customized compact model parameters from electrical test data
IBM0 citations37