Inventor
KASUYA KEIGO
JP17 patents
⚠️ This page may combine multiple inventors who share the name “KASUYA KEIGO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
13 patentsUS10707046B2Jul 7, 2020
Electron source and electron beam device using the same
HITACHI HIGH TECH CORP3 citations73
US10522319B2Dec 31, 2019
Electron beam apparatus
HITACHI HIGH TECH CORP2 citations73
US10903037B2Jan 26, 2021
Charged particle beam device
HITACHI HIGH TECH CORP2 citations72
US12494338B2Dec 9, 2025
Electron source, electron beam device, and method for manufacturing electron source
HITACHI HIGH TECH CORP0 citations62
US12469665B2Nov 11, 2025
Charged particle beam device
HITACHI HIGH TECH CORP0 citations62
US12400823B2Aug 26, 2025
Electron source, method of manufacturing the same, and electron beam apparatus using the same
HITACHI HIGH TECH CORP0 citations62
US10804084B2Oct 13, 2020
Vacuum apparatus
HITACHI HIGH TECH CORP1 citations62
US12469664B2Nov 11, 2025
Charged particle gun and charged particle beam system
HITACHI HIGH TECH CORP0 citations61
US11508544B2Nov 22, 2022
Thermoelectric field emission electron source and electron beam application device
HITACHI HIGH TECH CORP0 citations60
US11322329B2May 3, 2022
Electron source, method for manufacturing the same, and electron beam device using the same
HITACHI HIGH TECH CORP0 citations60
US12394585B2Aug 19, 2025
Electron source, electron gun, and charged particle beam device
HITACHI HIGH TECH CORP0 citations59
US11894211B2Feb 6, 2024
Electron beam apparatus and method for controlling electron beam apparatus
HITACHI HIGH TECH CORP0 citations58
US10586674B2Mar 10, 2020
Field emission electron source, method for manufacturing same, and electron beam device
HITACHI HIGH TECH CORP0 citations52
KASUYA KEIGO
3 patentsUS8426835B2Apr 23, 2013
Charged particle radiation device
KASUYA KEIGO8 citations82
US8319193B2Nov 27, 2012
Charged particle beam apparatus, and method of controlling the same
KASUYA KEIGO2 citations59
US8772735B2Jul 8, 2014
Charged particle beam apparatus, and method of controlling the same
KASUYA KEIGO1 citations49