P

Inventor

ARAI NORIAKI

JP31 patents
⚠️ This page may combine multiple inventors who share the name “ARAI NORIAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

16 patents
US6956211B2Oct 18, 2005

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP15 citations93
US7705300B2Apr 27, 2010

Charged particle beam adjusting method and charged particle beam apparatus

HITACHI HIGH TECH CORP15 citations84
US7282722B2Oct 16, 2007

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP10 citations84
US7459681B2Dec 2, 2008

Scanning electron microscope

HITACHI HIGH TECH CORP8 citations74
US7408172B2Aug 5, 2008

Charged particle beam apparatus and charged particle beam irradiation method

HITACHI HIGH TECH CORP8 citations74
US10707046B2Jul 7, 2020

Electron source and electron beam device using the same

HITACHI HIGH TECH CORP3 citations73
US10522319B2Dec 31, 2019

Electron beam apparatus

HITACHI HIGH TECH CORP2 citations73
US9640360B2May 2, 2017

Ion source and ion beam device using same

HITACHI HIGH TECH CORP2 citations73
US12494338B2Dec 9, 2025

Electron source, electron beam device, and method for manufacturing electron source

HITACHI HIGH TECH CORP0 citations62
US12400823B2Aug 26, 2025

Electron source, method of manufacturing the same, and electron beam apparatus using the same

HITACHI HIGH TECH CORP0 citations62
US7381951B2Jun 3, 2008

Charged particle beam adjustment method and apparatus

HITACHI HIGH TECH CORP4 citations62
US12469664B2Nov 11, 2025

Charged particle gun and charged particle beam system

HITACHI HIGH TECH CORP0 citations61
US11322329B2May 3, 2022

Electron source, method for manufacturing the same, and electron beam device using the same

HITACHI HIGH TECH CORP0 citations60
US10586674B2Mar 10, 2020

Field emission electron source, method for manufacturing same, and electron beam device

HITACHI HIGH TECH CORP0 citations52
US9508521B2Nov 29, 2016

Ion beam device

HITACHI HIGH TECH CORP0 citations52
US7566872B2Jul 28, 2009

Scanning electron microscope

HITACHI HIGH TECH CORP1 citations52

SHICHI HIROYASU

3 patents

ARAI NORIAKI

3 patents

CALIFORNIA INST OF TECHN

3 patents

HITACHI LTD

2 patents

NERIKI KK

1 patent

KAWANAMI YOSHIMI

1 patent

TOPPAN PRINTING CO LTD

1 patent

SAHO NORIHIDE

1 patent