Inventor
ARAI NORIAKI
JP31 patents
⚠️ This page may combine multiple inventors who share the name “ARAI NORIAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
16 patentsUS6956211B2Oct 18, 2005
Charged particle beam apparatus and charged particle beam irradiation method
HITACHI HIGH TECH CORP15 citations93
US7705300B2Apr 27, 2010
Charged particle beam adjusting method and charged particle beam apparatus
HITACHI HIGH TECH CORP15 citations84
US7282722B2Oct 16, 2007
Charged particle beam apparatus and charged particle beam irradiation method
HITACHI HIGH TECH CORP10 citations84
US7459681B2Dec 2, 2008
Scanning electron microscope
HITACHI HIGH TECH CORP8 citations74
US7408172B2Aug 5, 2008
Charged particle beam apparatus and charged particle beam irradiation method
HITACHI HIGH TECH CORP8 citations74
US10707046B2Jul 7, 2020
Electron source and electron beam device using the same
HITACHI HIGH TECH CORP3 citations73
US10522319B2Dec 31, 2019
Electron beam apparatus
HITACHI HIGH TECH CORP2 citations73
US9640360B2May 2, 2017
Ion source and ion beam device using same
HITACHI HIGH TECH CORP2 citations73
US12494338B2Dec 9, 2025
Electron source, electron beam device, and method for manufacturing electron source
HITACHI HIGH TECH CORP0 citations62
US12400823B2Aug 26, 2025
Electron source, method of manufacturing the same, and electron beam apparatus using the same
HITACHI HIGH TECH CORP0 citations62
US7381951B2Jun 3, 2008
Charged particle beam adjustment method and apparatus
HITACHI HIGH TECH CORP4 citations62
US12469664B2Nov 11, 2025
Charged particle gun and charged particle beam system
HITACHI HIGH TECH CORP0 citations61
US11322329B2May 3, 2022
Electron source, method for manufacturing the same, and electron beam device using the same
HITACHI HIGH TECH CORP0 citations60
US10586674B2Mar 10, 2020
Field emission electron source, method for manufacturing same, and electron beam device
HITACHI HIGH TECH CORP0 citations52
US9508521B2Nov 29, 2016
Ion beam device
HITACHI HIGH TECH CORP0 citations52
US7566872B2Jul 28, 2009
Scanning electron microscope
HITACHI HIGH TECH CORP1 citations52
SHICHI HIROYASU
3 patentsARAI NORIAKI
3 patentsCALIFORNIA INST OF TECHN
3 patentsUS11242290B2Feb 8, 2022
Freeze-cast ceramic membrane for size based filtration
CALIFORNIA INST OF TECHN2 citations70
US12157705B2Dec 3, 2024
Freeze-cast ceramic membrane for size based filtration
CALIFORNIA INST OF TECHN0 citations59
US11760698B2Sep 19, 2023
Freeze-cast ceramic membrane for size based filtration
CALIFORNIA INST OF TECHN1 citations59