Inventor

OHSHIMA TAKASHI

JP67 patents

⚠️ This page may combine multiple inventors who share the name “OHSHIMA TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OHSHIMA TAKASHI

HITACHI HIGH TECH CORP

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Sample base, charged particle beam device and sample observation method

Charged particle beam system and method for evacuation of the system

Electron microscope

Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer

Electron source and electron beam device using the same

Electron beam apparatus

Small electron gun

Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member

Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun

Sample holder with light emitting and transferring elements for a charged particle beam apparatus

Charged particle beam device

Electric field discharge-type electron source

Electron lens and charged particle beam apparatus

Absorption current image apparatus in electron microscope

Electron beam apparatus

Charged particle detector and charged particle beam apparatus

Electron microscope and electron beam detector

Electron source, method for manufacturing the same, and electron beam device using the same

HITACHI LTD

Transistor provided with strained germanium layer

Schottky emission cathode and a method of stabilizing the same

Transmission electron microscope

Electron beam source and its manufacturing method and electron beam source apparatus and electron beam apparatus using the same

Ion pump and charged particle beam device using the same

Ion beam device and sample observation method

HITACHI METALS TECHNO LTD

Lid for opening portion of free access floor panel

Free access floor panel

Free access floor panel

SHICHI HIROYASU

Gas field ion source, charged particle microscope, and apparatus

Gas field ion source, charged particle microscope, and apparatus

OHSHIMA TAKASHI

Electron beam device and electron beam application device using the same

Electron beam apparatus for visualizing a displacement of an electric field

MORISHITA HIDEO

Scanning electron microscope

Charged particle beam apparatus

KASUYA KEIGO

Charged particle radiation device

Charged particle beam apparatus, and method of controlling the same

AGENCY IND SCIENCE TECHN

Method of producing hetero structure

Method of forming a metal silicide film

HATANO MICHIO

Scanning electron microscope

Charged particle radiation device with bandpass detection

SENQCIA CORP

Lid member and floor panel using the same

Base isolation floor structure

UNIV TOKYO

Complex and method for producing epoxides by using the complex

FUJITSU LTD

Automatic IC mounting process and apparatus for performing the process

SCRIPPS RESEARCH INST

Analogs of sarcodictyin and eleutherobin

TAKASAGO PERFUMERY CO LTD

Polymer-supported metal

OKAMOTO MASAKAZU

Airbag

CANON MEDICAL SYSTEMS CORP

Computed tomography (CT) imaging system, radiation imaging system, and method of acquiring CT imaging data