Inventor

HASHIZUME TOMIHIRO

JP38 patents

⚠️ This page may combine multiple inventors who share the name “HASHIZUME TOMIHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HASHIZUME TOMIHIRO

HITACHI LTD

Electron exposure apparatus

Field effect transistor and manufacturing method thereof

Organic transistor using self-assembled monolayer

Field effect transistor having a structure in which an organic semiconductor that forms a channel is made of a single crystal or a polycrystal of organic molecules

Probe for scanning probe lithography and making method thereof

Thin-film transistor device and a method for manufacturing the same

Wiring and organic transistor, and manufacturing method thereof

Field effect transistor and its manufacturing method

Semiconductor device and its production method

Oscillator and frequency detector

Electron exposure device and method and electronic characteristics evaluation device using scanning probe

Ferromagnetic material and magnetic apparatus employing the ferromagnetic material

Ferromagnetic fine line and magnetic apparatus thereof

Ferromagnetic material and magnetic apparatus employing the ferromagnetic material

Electric-field-effect magnetoresistive devices and electronic devices using the magnetoresistive devices

Atomic wire and atomic wire switch

Sample holder and analytical vacuum device

Organic thin film transistor array and method of manufacturing the same

Scanning probe microscope and its sample holder

Ferromagnetic material and magnetic apparatus employing the ferromagnetic material

Atomic wire and atomic wire switch

Method of coating substrate

HITACHI HIGH TECH CORP

Electron source and electron beam device using the same

Electron beam apparatus

Electron source, electron beam device, and method for manufacturing electron source

Electron source, method of manufacturing the same, and electron beam apparatus using the same

Particle measuring device and particle measuring method

Electron source, method for manufacturing the same, and electron beam device using the same

Field ionization source, ion beam apparatus, and beam irradiation method

Ion beam device and cleaning method for gas field ion source

Field emission electron source, method for manufacturing same, and electron beam device

Ion beam apparatus and ion beam irradiation method

Sample for measuring particles, method for measuring particles and apparatus for measuring particles

SHICHI HIROYASU

Gas field ion source, charged particle microscope, and apparatus

Gas field ion source, charged particle microscope, and apparatus

HITCHI LTD

Micro-fabricated device with integrated electrostatic actuator

KAWANAMI YOSHIMI

Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same

NAMBU AKIRA

Scanning probe microscope and measuring method using same