Inventor
SCHINK HELMUT
DE6 patents
Patents
6 patentsUS4609867ASep 2, 1986
Method for measuring electrical potentials at buried solid state matter
SIEMENS AG15 citations70
US4739388AApr 19, 1988
Integrated circuit structure for a quality check of a semiconductor substrate wafer
SIEMENS AG10 citations65
US4839607AJun 13, 1989
Frequency-doubling amplifying surface wave receiver
SIEMENS AG2 citations59
US4646253AFeb 24, 1987
Method for imaging electrical barrier layers such as pn-junctions in semiconductors by means of processing particle-beam-induced signals in a scanning corpuscular microscope
SIEMENS AG4 citations57
US4928069AMay 22, 1990
Amplifying surface wave receiver
SIEMENS AG1 citations41
US6810117B1Oct 26, 2004
Method and circuit for simultaneously establishing communication links between a subscriber station and further subscriber stations
SIEMENS AG0 citations39