Inventor
CHEN HAI-CHING
TW188 patents
⚠️ This page may combine multiple inventors who share the name “CHEN HAI-CHING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
34 patentsUS9659864B2May 23, 2017
Method and apparatus for forming self-aligned via with selectively deposited etching stop layer
TAIWAN SEMICONDUCTOR MFG CO LTD24 citations94
US9773676B2Sep 26, 2017
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG CO LTD17 citations93
US11527649B1Dec 13, 2022
Ferroelectric field effect transistor devices and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations85
US11251073B2Feb 15, 2022
Selective deposition of barrier layer
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11222843B2Jan 11, 2022
Interconnect structure and method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US11189560B2Nov 30, 2021
Semiconductor device comprising etch stop layer over dielectric layer and method of manufacture
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US11004740B2May 11, 2021
Structure and method for interconnection with self-alignment
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US10211097B2Feb 19, 2019
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10014175B2Jul 3, 2018
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US10008382B2Jun 26, 2018
Semiconductor device having a porous low-k structure
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9941157B2Apr 10, 2018
Porogen bonded gap filling material in semiconductor manufacturing
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9922927B2Mar 20, 2018
Method and apparatus for forming self-aligned via with selectively deposited etching stop layer
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations84
US9818690B2Nov 14, 2017
Self-aligned interconnection structure and method
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US9484211B2Nov 1, 2016
Etchant and etching process
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US12512403B2Dec 30, 2025
Method of forming semiconductor device comprising conductive feature, dielectric layer adjacent conductive feature, and etch stop layer on top surface of dielectric layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations75
US11908792B2Feb 20, 2024
Semiconductor device comprising cap layer over dielectric layer and method of manufacture
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations75
US12176246B2Dec 24, 2024
Dielectric capping structure overlying a conductive structure to increase stability
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US12089415B2Sep 10, 2024
Metal layers for increasing polarization of ferroelectric memory device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11818896B2Nov 14, 2023
Cocktail layer over gate dielectric layer of FET FeRAM
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11810815B2Nov 7, 2023
Dielectric capping structure overlying a conductive structure to increase stability
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US11508755B2Nov 22, 2022
Stacked ferroelectric structure
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11355430B2Jun 7, 2022
Capping layer overlying dielectric structure to increase reliability
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11355390B2Jun 7, 2022
Interconnect strucutre with protective etch-stop
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11322395B2May 3, 2022
Dielectric capping structure overlying a conductive structure to increase stability
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11081447B2Aug 3, 2021
Graphene-assisted low-resistance interconnect structures and methods of formation thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11075113B2Jul 27, 2021
Metal capping layer and methods thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10943867B2Mar 9, 2021
Schemes for forming barrier layers for copper in interconnect structures
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10930551B2Feb 23, 2021
Methods for fabricating a low-resistance interconnect
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10867850B2Dec 15, 2020
Selective deposition method for forming semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US10867913B2Dec 15, 2020
Method and apparatus for forming self-aligned via with selectively deposited etching stop layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10854458B2Dec 1, 2020
Method and structure for semiconductor device having gate spacer protection layer
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10527788B2Jan 7, 2020
Package structure and methods of forming same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10408998B2Sep 10, 2019
Method of fabrication polymer waveguide
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10353147B2Jul 16, 2019
Etchant and etching process for substrate of a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
TAIWAN SEMICONDUCTOR MFG
11 patentsUS9134633B2Sep 15, 2015
System and method for dark field inspection
TAIWAN SEMICONDUCTOR MFG63 citations98
US9177797B2Nov 3, 2015
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG28 citations94
US9041015B2May 26, 2015
Package structure and methods of forming same
TAIWAN SEMICONDUCTOR MFG17 citations93
US8729703B2May 20, 2014
Schemes for forming barrier layers for copper in interconnect structures
TAIWAN SEMICONDUCTOR MFG9 citations93
US9335473B2May 10, 2016
Package structure and methods of forming same
TAIWAN SEMICONDUCTOR MFG7 citations84
US9230911B2Jan 5, 2016
Interconnect structure and method of forming the same
TAIWAN SEMICONDUCTOR MFG9 citations84
US9129968B2Sep 8, 2015
Schemes for forming barrier layers for copper in interconnect structures
TAIWAN SEMICONDUCTOR MFG4 citations84
US8976833B2Mar 10, 2015
Light coupling device and methods of forming same
TAIWAN SEMICONDUCTOR MFG11 citations84
US7964496B2Jun 21, 2011
Schemes for forming barrier layers for copper in interconnect structures
TAIWAN SEMICONDUCTOR MFG7 citations84
US7682963B2Mar 23, 2010
Air gap for interconnect application
TAIWAN SEMICONDUCTOR MFG9 citations84
US7928549B2Apr 19, 2011
Integrated circuit devices with multi-dimensional pad structures
TAIWAN SEMICONDUCTOR MFG9 citations79
YU CHEN-HUA
3 patentsUS8440564B2May 14, 2013
Schemes for forming barrier layers for copper in interconnect structures
YU CHEN-HUA9 citations93
US8446012B2May 21, 2013
Interconnect structures
YU CHEN-HUA10 citations84
US8232201B2Jul 31, 2012
Schemes for forming barrier layers for copper in interconnect structures
YU CHEN-HUA5 citations74
TSENG CHUN-HAO
1 patentLO CHING-YU
1 patentShowing the top 50 of 188 patents by PatentIndex Score.